dc.contributor.author | Lau, Timothy T. | |
dc.contributor.author | Kushima, Akihiro | |
dc.contributor.author | Yip, Sidney | |
dc.date.accessioned | 2010-09-20T19:41:54Z | |
dc.date.available | 2010-09-20T19:41:54Z | |
dc.date.issued | 2010-04 | |
dc.date.submitted | 2010-03 | |
dc.identifier.issn | 0031-9007 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/58606 | |
dc.description.abstract | We describe a method to simulate on macroscopic time scales the stress relaxation in an atomistic nanocrystal model under an imposed strain. Using a metadynamics algorithm for transition state pathway sampling we follow the full evolution of a classical anelastic relaxation event, with relaxation times governed by the nanoscale microstructure imperfections in the solid. We show that probing this sensitive variation leads to mechanistic insights that reveal a direct correlation between system-level relaxation behavior and localized atomic displacements in the vicinity of the nanostructured defects, in turn implying a unit mechanism for self-organized plastic response. This suggests a new class of measurements in which the microstructure imperfections are characterized and matched to predictive simulations enabled by the present method. | en_US |
dc.description.sponsorship | National Defense Science and Engineering Graduate Fellowship | en_US |
dc.description.sponsorship | SKF Global, Inc. | en_US |
dc.description.sponsorship | Corning Incorporated | en_US |
dc.description.sponsorship | HondaR&D, Inc. | en_US |
dc.language.iso | en_US | |
dc.publisher | American Physical Society | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1103/PhysRevLett.104.175501 | en_US |
dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
dc.source | APS | en_US |
dc.title | Atomistic Simulation of Creep in a Nanocrystal | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Lau, Timothy T., Akihiro Kushima, and Sidney Yip. “Atomistic Simulation of Creep in a Nanocrystal.” Physical Review Letters 104.17 (2010): 175501. © 2010 The American Physical Society | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Nuclear Science and Engineering | en_US |
dc.contributor.approver | Yip, Sidney | |
dc.contributor.mitauthor | Lau, Timothy T. | |
dc.contributor.mitauthor | Kushima, Akihiro | |
dc.contributor.mitauthor | Yip, Sidney | |
dc.relation.journal | Physical Review Letters | en_US |
dc.eprint.version | Final published version | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dspace.orderedauthors | Lau, Timothy T.; Kushima, Akihiro; Yip, Sidney | en |
dc.identifier.orcid | https://orcid.org/0000-0002-2727-0137 | |
mit.license | PUBLISHER_POLICY | en_US |
mit.metadata.status | Complete | |