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dc.contributor.authorLau, Timothy T.
dc.contributor.authorKushima, Akihiro
dc.contributor.authorYip, Sidney
dc.date.accessioned2010-09-20T19:41:54Z
dc.date.available2010-09-20T19:41:54Z
dc.date.issued2010-04
dc.date.submitted2010-03
dc.identifier.issn0031-9007
dc.identifier.urihttp://hdl.handle.net/1721.1/58606
dc.description.abstractWe describe a method to simulate on macroscopic time scales the stress relaxation in an atomistic nanocrystal model under an imposed strain. Using a metadynamics algorithm for transition state pathway sampling we follow the full evolution of a classical anelastic relaxation event, with relaxation times governed by the nanoscale microstructure imperfections in the solid. We show that probing this sensitive variation leads to mechanistic insights that reveal a direct correlation between system-level relaxation behavior and localized atomic displacements in the vicinity of the nanostructured defects, in turn implying a unit mechanism for self-organized plastic response. This suggests a new class of measurements in which the microstructure imperfections are characterized and matched to predictive simulations enabled by the present method.en_US
dc.description.sponsorshipNational Defense Science and Engineering Graduate Fellowshipen_US
dc.description.sponsorshipSKF Global, Inc.en_US
dc.description.sponsorshipCorning Incorporateden_US
dc.description.sponsorshipHondaR&D, Inc.en_US
dc.language.isoen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevLett.104.175501en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleAtomistic Simulation of Creep in a Nanocrystalen_US
dc.typeArticleen_US
dc.identifier.citationLau, Timothy T., Akihiro Kushima, and Sidney Yip. “Atomistic Simulation of Creep in a Nanocrystal.” Physical Review Letters 104.17 (2010): 175501. © 2010 The American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Nuclear Science and Engineeringen_US
dc.contributor.approverYip, Sidney
dc.contributor.mitauthorLau, Timothy T.
dc.contributor.mitauthorKushima, Akihiro
dc.contributor.mitauthorYip, Sidney
dc.relation.journalPhysical Review Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsLau, Timothy T.; Kushima, Akihiro; Yip, Sidneyen
dc.identifier.orcidhttps://orcid.org/0000-0002-2727-0137
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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