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dc.contributor.authorLee, Kayi
dc.contributor.authorModiano, Eytan H.
dc.date.accessioned2010-09-30T16:03:21Z
dc.date.available2010-09-30T16:03:21Z
dc.date.issued2009-06
dc.identifier.isbn978-1-4244-3512-8
dc.identifier.issn0743-166X
dc.identifier.urihttp://hdl.handle.net/1721.1/58790
dc.description.abstractIn layered networks, a single failure at a lower layer may cause multiple failures in the upper layers. As a result, traditional schemes that protect against single failures may not be effective in cross-layer networks. In this paper, we introduce the problem of maximizing the connectivity of layered networks. We show that connectivity metrics in layered networks have significantly different meaning than their single-layer counterparts. Results that are fundamental to survivable single-layer network design, such as the Max-Flow Min-Cut theorem, are no longer applicable to the layered setting. We propose new metrics to measure connectivity in layered networks and analyze their properties. We use one of the metrics, Min Cross Layer Cut, as the objective for the survivable lightpath routing problem, and develop several algorithms to produce lightpath routings with high survivability. This allows the resulting cross-layer architecture to be resilient to failures.en_US
dc.description.sponsorshipNational Science Foundation (grants CNS-0626781 and CNS-0830961)en_US
dc.description.sponsorshipUnited States. Defense Threat Reduction Agency (grant HDTRA1-07-1-0004)en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/INFCOM.2009.5062013en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleCross-layer survivability in WDM-based networksen_US
dc.typeArticleen_US
dc.identifier.citationLee, K., and E. Modiano. “Cross-Layer Survivability in WDM-Based Networks.” INFOCOM 2009, IEEE. 2009. 1017-1025. © 2009 IEEEen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Aeronautics and Astronauticsen_US
dc.contributor.approverModiano, Eytan H.
dc.contributor.mitauthorLee, Kayi
dc.contributor.mitauthorModiano, Eytan H.
dc.relation.journalIEEE INFOCOM 2009en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsLee, K.; Modiano, E.en
dc.identifier.orcidhttps://orcid.org/0000-0001-8238-8130
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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