| dc.contributor.author | Yu, Meng-Day (Mandel) | |
| dc.contributor.author | Devadas, Srinivas | |
| dc.date.accessioned | 2010-11-04T14:26:09Z | |
| dc.date.available | 2010-11-04T14:26:09Z | |
| dc.date.issued | 2010-01 | |
| dc.date.submitted | 2010-02 | |
| dc.identifier.issn | 0740-7475 | |
| dc.identifier.other | INSPEC Accession Number: 11105480 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/59809 | |
| dc.description.abstract | Physical unclonable functions (PUFs) offer a promising mechanism that can be used in many security, protection, and digital rights management applications. One key issue is the stability of PUF responses that is often addressed by error correction codes. The authors propose a new syndrome coding scheme that limits the amount of leaked information by the PUF error-correcting codes. | en_US |
| dc.language.iso | en_US | |
| dc.publisher | Institute of Electrical and Electronics Engineers | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1109/MDT.2010.25 | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | IEEE | en_US |
| dc.subject | ECC | en_US |
| dc.subject | design and test | en_US |
| dc.subject | error correction | en_US |
| dc.subject | error-correcting code | en_US |
| dc.subject | index-based syndrome coding | en_US |
| dc.subject | key generation | en_US |
| dc.subject | physical unclonable function | en_US |
| dc.subject | syndrome coding | en_US |
| dc.title | Secure and Robust Error Correction for Physical Unclonable Functions | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Meng-Day Yu, and S. Devadas. “Secure and Robust Error Correction for Physical Unclonable Functions.” Design & Test of Computers, IEEE 27.1 (2010): 48-65. ©2010 Institute of Electrical and Electronics Engineers. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
| dc.contributor.approver | Devadas, Srinivas | |
| dc.contributor.mitauthor | Devadas, Srinivas | |
| dc.relation.journal | IEEE Design & Test of Computers | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dspace.orderedauthors | Yu, Meng-Day (Mandel); Devadas, Srinivas | en |
| dc.identifier.orcid | https://orcid.org/0000-0001-8253-7714 | |
| mit.license | PUBLISHER_POLICY | en_US |
| mit.metadata.status | Complete | |