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dc.contributor.authorYu, Meng-Day (Mandel)
dc.contributor.authorDevadas, Srinivas
dc.date.accessioned2010-11-04T18:52:14Z
dc.date.available2010-11-04T18:52:14Z
dc.date.issued2010-03
dc.identifier.urihttp://hdl.handle.net/1721.1/59817
dc.description.abstractA new Physical Unclonable Function (PUF) construction is described, by treating silicon unique features extracted from PUF circuits as “genetic material” unique to each silicon, and recombining this chip-unique material in a way to obtain a combination of advantages not possible with the original PUF circuits, including altering PUF output statistics to better suit PUF-based key generation and authentication.en_US
dc.language.isoen_US
dc.publisherUnited States. Dept. of Defenseen_US
dc.relation.isversionofhttp://www.gomactech.net/2010/index.htmlen_US
dc.rightsAttribution-Noncommercial-Share Alike 3.0 Unporteden_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/en_US
dc.sourceMIT web domainen_US
dc.titleRecombination of Physical Unclonable Functionsen_US
dc.typeArticleen_US
dc.identifier.citationDevadas, Srinivas and Meng-Day (Mandel) Yu “Recombination of Physical Unclonable Functions.” 35th Annual GOMACTech Conference, 2010, March 22-25, 2010, Reno, NV.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.approverDevadas, Srinivas
dc.contributor.mitauthorDevadas, Srinivas
dc.relation.journal35th Annual GOMACTech Conference, 2010en_US
dc.eprint.versionOriginal manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dspace.orderedauthorsYu, Meng-Day (Mandel); Devadas, Srinivas
dc.identifier.orcidhttps://orcid.org/0000-0001-8253-7714
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


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