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dc.contributor.authorFedkiw, Timothy Peter
dc.contributor.authorLozano, Paulo C.
dc.date.accessioned2010-11-23T13:44:32Z
dc.date.available2010-11-23T13:44:32Z
dc.date.issued2009-11
dc.date.submitted2009-07
dc.identifier.issn0734-2101
dc.identifier.issn1071-1023
dc.identifier.urihttp://hdl.handle.net/1721.1/60026
dc.description.abstractEmission of positive and negative ions is possible when a room temperature molten salt, or ionic liquid, is exposed to a sufficiently high electric field. Ionic liquid ion sources (ILIS) have shown potential to be used in various focused ion beam (FIB) applications, since their operation and characteristics are similar to those of liquid metal ion sources, with the advantage that ILIS work at low temperatures in comparison and a large number of ionic liquids with many different compositions are available. In this paper we present results on the emission characteristics of negative ions extracted from an iodine-based ionic liquid using a time-of-flight mass spectrometer and a retarding potential analyzer. The ionic liquid BMI-I is used as source media, producing a droplet free beam with multiple solvated ion species. Attention is given to BMI-I in particular due to the potential of creating a beam of pure and clustered I- ions, which are expected to improve the performance in applications based on secondary emission and reactive species. Properties important to the focusing of the ion beam such as mass and energy distributions are obtained. Effects on the ion emission are studied through a comparison of the source using temperature as a parameter to modify the liquid viscosity and electrical conductivity.en_US
dc.description.sponsorshipMassachusetts Institute of Technology. Dept. of Aeronautics and Astronauticsen_US
dc.language.isoen_US
dc.publisherAmerican Vacuum Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1116/1.3253604en_US
dc.rightsAttribution-Noncommercial-Share Alike 3.0 Unporteden_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/en_US
dc.sourceP. Lozanoen_US
dc.titleDevelopment and characterization of an iodine field emission ion source for FIB applicationsen_US
dc.title.alternativeDevelopment and characterization of an iodine field emission ion source for focused ion beam applicationsen_US
dc.typeArticleen_US
dc.identifier.citationFedkiw, Timothy P., and Paulo C. Lozano. “Development and characterization of an iodine field emission ion source for focused ion beam applications.” J. Vac. Sci. Technol. B. AVS, 2009. 2648-2653.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Aeronautics and Astronauticsen_US
dc.contributor.approverLozano, Paulo C.
dc.contributor.mitauthorFedkiw, Timothy Peter
dc.contributor.mitauthorLozano, Paulo C.
dc.relation.journalJournal of Vacuum Science and Technology Ben_US
dc.eprint.versionAuthor's final manuscript
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsFedkiw, Timothy P.; Lozano, Paulo C.en
dc.identifier.orcidhttps://orcid.org/0000-0002-6063-3227
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


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