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dc.contributor.authorPark, Min
dc.contributor.authorPerrott, Michael H.
dc.date.accessioned2010-12-03T15:05:00Z
dc.date.available2010-12-03T15:05:00Z
dc.date.issued2009-06
dc.date.submitted2009-05
dc.identifier.isbn978-1-4244-3827-3
dc.identifier.otherINSPEC Accession Number: 10760815
dc.identifier.urihttp://hdl.handle.net/1721.1/60074
dc.description.abstractA voltage-controlled oscillator (VCO) based analog-to-digital converter (ADC) utilizing Sigma-Delta (Sigma-Delta) techniques for second order quantization noise shaping is presented. A custom IC prototype of this highly digital architecture achieves 60-dB signal-to-noise ratio (SNR) over a 1-MHz bandwidth with 800-MHz sampling rate. It was fabricated in a 0.18-mum 1-poly 5-metal CMOS technology.en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (grant 0238166)en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/ISCAS.2009.5118466en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleA VCO-based analog-to-digital converter with second-order sigma-delta noise shapingen_US
dc.typeArticleen_US
dc.identifier.citationMin Park, and M.H. Perrott. “A VCO-based analog-to-digital converter with second-order Sigma-Delta noise shaping.” Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on. 2009. 3130-3133. © 2009 IEEE.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.approverPark, Min
dc.contributor.mitauthorPark, Min
dc.contributor.mitauthorPerrott, Michael H.
dc.relation.journalIEEE International Symposium on Circuits and Systems, 2009. ISCAS 2009en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dspace.orderedauthorsMin Park; Perrott, Michael H.en
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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