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Fiber-coupled nanowire photon counter at 1550 nm with 24% system detection efficiency

dc.contributor.authorHu, Xiaolong
dc.contributor.authorZhong, Tian
dc.contributor.authorWhite, James E.
dc.contributor.authorDauler, Eric A.
dc.contributor.authorNajafi, Faraz
dc.contributor.authorHerder, Charles Henry
dc.contributor.authorWong, Franco N. C.
dc.contributor.authorBerggren, Karl K.
dc.date.accessioned2010-12-09T14:54:43Z
dc.date.available2010-12-09T14:54:43Z
dc.date.issued2009-11
dc.date.submitted2009-10
dc.identifier.issn0146-9592
dc.identifier.issn1539-4794
dc.identifier.urihttp://hdl.handle.net/1721.1/60249
dc.description.abstractWe developed a fiber-coupled superconducting nanowire single-photon detector system in a close-cycled cryocooler and achieved 24% and 22% system detection efficiencies at wavelengths of 1550 and 1315 nm, respectively. The maximum dark count rate was ~1000 counts/s.en_US
dc.description.sponsorshipUnited States. Intelligence Advanced Research Projects Activity (IARPA)en_US
dc.description.sponsorshipUnited States. Dept. of the Air Force (FA8721-05-C-0002)en_US
dc.language.isoen_US
dc.publisherOptical Society of Americaen_US
dc.relation.isversionofhttp://dx.doi.org/10.1364/OL.34.003607en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceMIT web domainen_US
dc.titleFiber-coupled nanowire photon counter at 1550 nm with 24% system detection efficiencyen_US
dc.typeArticleen_US
dc.identifier.citationXiaolong Hu, Tian Zhong, James E. White, Eric A. Dauler, Faraz Najafi, Charles H. Herder, Franco N. C. Wong, and Karl K. Berggren, "Fiber-coupled nanowire photon counter at 1550 nm with 24% system detection efficiency," Opt. Lett. 34, 3607-3609 (2009) © 2009 Optical Society of Americaen_US
dc.contributor.departmentLincoln Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.approverBerggren, Karl K.
dc.contributor.mitauthorHu, Xiaolong
dc.contributor.mitauthorZhong, Tian
dc.contributor.mitauthorWhite, James E.
dc.contributor.mitauthorDauler, Eric A.
dc.contributor.mitauthorNajafi, Faraz
dc.contributor.mitauthorHerder, Charles Henry
dc.contributor.mitauthorWong, Franco N. C.
dc.contributor.mitauthorBerggren, Karl K.
dc.relation.journalOptics Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsHu, Xiaolong; Zhong, Tian; White, James E.; Dauler, Eric A.; Najafi, Faraz; Herder, Charles Henry; Wong, Franco N.; Berggren, Karl K.en
dc.identifier.orcidhttps://orcid.org/0000-0003-1117-7293
dc.identifier.orcidhttps://orcid.org/0000-0003-1998-6159
dc.identifier.orcidhttps://orcid.org/0000-0001-7453-9031
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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