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dc.contributor.authorChuang, Isaac L.
dc.contributor.authorKim, Tony Hyun
dc.contributor.authorHerskind, Peter F.
dc.contributor.authorKim, Taehyun
dc.contributor.authorKim, Jungsang
dc.date.accessioned2010-12-22T15:54:29Z
dc.date.available2010-12-22T15:54:29Z
dc.date.issued2010-10
dc.date.submitted2010-08
dc.identifier.issn1050-2947
dc.identifier.issn1094-1622
dc.identifier.urihttp://hdl.handle.net/1721.1/60356
dc.description.abstractWe present a model as well as experimental results for a surface electrode radiofrequency Paul trap that has a circular electrode geometry well suited for trapping single ions and two-dimensional planar ion crystals. The trap design is compatible with microfabrication and offers a simple method by which the height of the trapped ions above the surface may be changed in situ. We demonstrate trapping of single [superscript 88]Sr[superscript +] ions over an ion height range of 200-1000 mu m for several hours under Doppler laser cooling and use these to characterize the trap, finding good agreement with our model.en_US
dc.description.sponsorshipSiebel Scholars Foundationen_US
dc.description.sponsorshipCarlsberg Foundationen_US
dc.description.sponsorshipLundbeck Foundationen_US
dc.description.sponsorshipUnited States. Army Research Office (COMMIT project)en_US
dc.description.sponsorshipNational Science Foundation (U.S.)en_US
dc.language.isoen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevA.82.043412en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleSurface-electrode point Paul trapen_US
dc.typeArticleen_US
dc.identifier.citationKim, Tony Hyun et al. “Surface-electrode point Paul trap.” Physical Review A 82.4 (2010): 043412. © 2010 The American Physical Society.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.approverChuang, Isaac L.
dc.contributor.mitauthorChuang, Isaac L.
dc.contributor.mitauthorKim, Tony Hyun
dc.contributor.mitauthorHerskind, Peter F.
dc.relation.journalPhysical Review Aen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsKim, Tony; Herskind, Peter; Kim, Taehyun; Kim, Jungsang; Chuang, Isaacen
dc.identifier.orcidhttps://orcid.org/0000-0001-7296-523X
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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