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dc.contributor.authorPaus, Christoph M. E.
dc.contributor.authorGomez-Ceballos, Guillelmo
dc.contributor.authorGoncharov, Maxim
dc.contributor.authorBauer, Gerry P
dc.contributor.authorMakhoul, Khaldoun
dc.date.accessioned2011-01-06T21:06:18Z
dc.date.available2011-01-06T21:06:18Z
dc.date.issued2010-08
dc.date.submitted2010-06
dc.identifier.issn0031-9007
dc.identifier.urihttp://hdl.handle.net/1721.1/60385
dc.description.abstractWe present a measurement of the electric charge of the top quark using pp[over-bar] collisions corresponding to an integrated luminosity of 2.7  fb[superscript -1] at the CDF II detector. We reconstruct tt[over-bar] events in the lepton+jets final state. We use soft lepton taggers to determine the flavor of the b jets, which we use to reconstruct the top quark’s electric charge and exclude an exotic top quark with -4/3 charge at 95% confidence level. This is the strongest exclusion of the exotic charge scenario and the first to use soft leptons for this purpose.en_US
dc.description.sponsorshipUnited States. Dept. of Energyen_US
dc.description.sponsorshipNational Science Foundation (U.S.)en_US
dc.description.sponsorshipIstituto Nazionale di Fisica Nucleare of Italyen_US
dc.description.sponsorshipJapan. Ministry of Education, Culture, Sports, Science and Technologyen_US
dc.description.sponsorshipNatural Sciences and Engineering Research Council of Canadaen_US
dc.description.sponsorshipNational Science Council (China)en_US
dc.description.sponsorshipNational Science Council of the Republic of Chinaen_US
dc.description.sponsorshipSwiss National Science Foundationen_US
dc.description.sponsorshipAlfred P. Sloan Foundationen_US
dc.description.sponsorshipBundesministerium für Bildung und Forschung, Germanyen_US
dc.description.sponsorshipWorld Class University Program (Korea)en_US
dc.description.sponsorshipScience and Technology Facilities Council, United Kingdomen_US
dc.description.sponsorshipInstitut National de Physique Nucleaire et Physique des Particules/CNRSen_US
dc.description.sponsorshipRussian Foundation for Basic Researchen_US
dc.description.sponsorshipMinisterio de Ciencia e Innovación, Spainen_US
dc.description.sponsorshipPrograma Consolider-Ingenio 2010, Spainen_US
dc.description.sponsorshipSlovak R&D Agencyen_US
dc.description.sponsorshipAcademy of Finlanden_US
dc.language.isoen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevLett.105.101801en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleExclusion of an Exotic Top Quark with-4/3 Electric Charge Using Soft Lepton Taggingen_US
dc.typeArticleen_US
dc.identifier.citationCDF Collaboration et al. “Exclusion of an Exotic Top Quark with -4/3 Electric Charge Using Soft Lepton Tagging.” Physical Review Letters 105.10 (2010): 101801. © 2010 The American Physical Society.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Laboratory for Nuclear Scienceen_US
dc.contributor.approverPaus, Christoph M. E.
dc.contributor.mitauthorPaus, Christoph M. E.
dc.contributor.mitauthorBauer, Gerry P.
dc.contributor.mitauthorGomez-Ceballos, Guillelmo
dc.contributor.mitauthorGoncharov, Maxim
dc.contributor.mitauthorMakhoul, K.
dc.relation.journalPhysical Review Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsAaltonen, T.; Adelman, J.; Álvarez González, B.; Amerio, S.; Amidei, D.; Anastassov, A.; Annovi, A.; Antos, J.; Apollinari, G.; Appel, J.; Apresyan, A.; Arisawa, T.; Artikov, A.; Asaadi, J.; Ashmanskas, W.; Attal, A.; Aurisano, A.; Azfar, F.; Badgett, W.; Barbaro-Galtieri, A.; Barnes, V.; Barnett, B.; Barria, P.; Bartos, P.; Bauer, G.; Beauchemin, P.-H.; Bedeschi, F.; Beecher, D.; Behari, S.; Bellettini, G.; Bellinger, J.; Benjamin, D.; Beretvas, A.; Bhatti, A.; Binkley, M.; Bisello, D.; Bizjak, I.; Blair, R.; Blocker, C.; Blumenfeld, B.; Bocci, A.; Bodek, A.; Boisvert, V.; Bortoletto, D.; Boudreau, J.; Boveia, A.; Brau, B.; Bridgeman, A.; Brigliadori, L.; Bromberg, C.; Brubaker, E.; Budagov, J.; Budd, H.; Budd, S.; Burkett, K.; Busetto, G.; Bussey, P.; Buzatu, A.; Byrum, K.; Cabrera, S.; Calancha, C.; Camarda, S.; Campanelli, M.; Campbell, M.; Canelli, F.; Canepa, A.; Carls, B.; Carlsmith, D.; Carosi, R.; Carrillo, S.; Carron, S.; Casal, B.; Casarsa, M.; Castro, A.; Catastini, P.; Cauz, D.; Cavaliere, V.; Cavalli-Sforza, M.; Cerri, A.; Cerrito, L.; Chang, S.; Chen, Y.; Chertok, M.; Chiarelli, G.; Chlachidze, G.; Chlebana, F.; Cho, K.; Chokheli, D.; Chou, J.; Chung, K.; Chung, W.; Chung, Y.; Chwalek, T.; Ciobanu, C.; Ciocci, M.; Clark, A.; Clark, D.; Compostella, G.; Convery, M.; Conway, J.; Corbo, M.; Cordelli, M.; Cox, C.; Cox, D.; Crescioli, F.; Cuenca Almenar, C.; Cuevas, J.; Culbertson, R.; Cully, J.; Dagenhart, D.; d’Ascenzo, N.; Datta, M.; Davies, T.; de Barbaro, P.; De Cecco, S.; Deisher, A.; De Lorenzo, G.; Dell’Orso, M.; Deluca, C.; Demortier, L.; Deng, J.; Deninno, M.; d’Errico, M.; Di Canto, A.; Di Ruzza, B.; Dittmann, J.; D’Onofrio, M.; Donati, S.; Dong, P.; Dorigo, T.; Dube, S.; Ebina, K.; Elagin, A.; Erbacher, R.; Errede, D.; Errede, S.; Ershaidat, N.; Eusebi, R.; Fang, H.; Farrington, S.; Fedorko, W.; Feild, R.; Feindt, M.; Fernandez, J.; Ferrazza, C.; Field, R.; Flanagan, G.; Forrest, R.; Frank, M.; Franklin, M.; Freeman, J.; Furic, I.; Gallinaro, M.; Galyardt, J.; Garberson, F.; Garcia, J.; Garfinkel, A.; Garosi, P.; Gerberich, H.; Gerdes, D.; Gessler, A.; Giagu, S.; Giakoumopoulou, V.; Giannetti, P.; Gibson, K.; Gimmell, J.; Ginsburg, C.; Giokaris, N.; Giordani, M.; Giromini, P.; Giunta, M.; Giurgiu, G.; Glagolev, V.; Glenzinski, D.; Gold, M.; Goldschmidt, N.; Golossanov, A.; Gomez, G.; Gomez-Ceballos, G.; Goncharov, M.; González, O.; Gorelov, I.; Goshaw, A.; Goulianos, K.; Gresele, A.; Grinstein, S.; Grosso-Pilcher, C.; Group, R.; Grundler, U.; Guimaraes da Costa, J.; Gunay-Unalan, Z.; Haber, C.; Hahn, S.; Halkiadakis, E.; Han, B.-Y.; Han, J.; Happacher, F.; Hara, K.; Hare, D.; Hare, M.; Harr, R.; Hartz, M.; Hatakeyama, K.; Hays, C.; Heck, M.; Heinrich, J.; Herndon, M.; Heuser, J.; Hewamanage, S.; Hidas, D.; Hill, C.; Hirschbuehl, D.; Hocker, A.; Hou, S.; Houlden, M.; Hsu, S.-C.; Hughes, R.; Hurwitz, M.; Husemann, U.; Hussein, M.; Huston, J.; Incandela, J.; Introzzi, G.; Iori, M.; Ivanov, A.; James, E.; Jang, D.; Jayatilaka, B.; Jeon, E.; Jha, M.; Jindariani, S.; Johnson, W.; Jones, M.; Joo, K.; Jun, S.; Jung, J.; Junk, T.; Kamon, T.; Kar, D.; Karchin, P.; Kato, Y.; Kephart, R.; Ketchum, W.; Keung, J.; Kietzman, B.; Khotilovich, V.; Kilminster, B.; Kim, D.; Kim, H.; Kim, H.; Kim, J.; Kim, M.; Kim, S.; Kim, S.; Kim, Y.; Kimura, N.; Kirsch, L.; Klimenko, S.; Kondo, K.; Kong, D.; Konigsberg, J.; Korytov, A.; Kotwal, A.; Kreps, M.; Kroll, J.; Krop, D.; Krumnack, N.; Kruse, M.; Krutelyov, V.; Kuhr, T.; Kulkarni, N.; Kurata, M.; Kwang, S.; Laasanen, A.; Lami, S.; Lammel, S.; Lancaster, M.; Lander, R.; Lannon, K.; Lath, A.; Latino, G.; Lazzizzera, I.; LeCompte, T.; Lee, E.; Lee, H.; Lee, J.; Lee, S.; Leone, S.; Lewis, J.; Lin, C.-J.; Linacre, J.; Lindgren, M.; Lipeles, E.; Lister, A.; Litvintsev, D.; Liu, C.; Liu, T.; Lockyer, N.; Loginov, A.; Lovas, L.; Lucchesi, D.; Lueck, J.; Lujan, P.; Lukens, P.; Lungu, G.; Lys, J.; Lysak, R.; MacQueen, D.; Madrak, R.; Maeshima, K.; Makhoul, K.; Maksimovic, P.; Malde, S.; Malik, S.; Manca, G.; Manousakis-Katsikakis, A.; Margaroli, F.; Marino, C.; Marino, C.; Martin, A.; Martin, V.; Martínez, M.; Martínez-Ballarín, R.; Mastrandrea, P.; Mathis, M.; Mattson, M.; Mazzanti, P.; McFarland, K.; McIntyre, P.; McNulty, R.; Mehta, A.; Mehtala, P.; Menzione, A.; Mesropian, C.; Miao, T.; Mietlicki, D.; Miladinovic, N.; Miller, R.; Mills, C.; Milnik, M.; Mitra, A.; Mitselmakher, G.; Miyake, H.; Moed, S.; Moggi, N.; Mondragon, M.; Moon, C.; Moore, R.; Morello, M.; Morlock, J.; Movilla Fernandez, P.; Mülmenstädt, J.; Mukherjee, A.; Muller, Th.; Murat, P.; Mussini, M.; Nachtman, J.; Nagai, Y.; Naganoma, J.; Nakamura, K.; Nakano, I.; Napier, A.; Nett, J.; Neu, C.; Neubauer, M.; Neubauer, S.; Nielsen, J.; Nodulman, L.; Norman, M.; Norniella, O.; Nurse, E.; Oakes, L.; Oh, S.; Oh, Y.; Oksuzian, I.; Okusawa, T.; Orava, R.; Osterberg, K.; Pagan Griso, S.; Pagliarone, C.; Palencia, E.; Papadimitriou, V.; Papaikonomou, A.; Paramanov, A.; Parks, B.; Pashapour, S.; Patrick, J.; Pauletta, G.; Paulini, M.; Paus, C.; Peiffer, T.; Pellett, D.; Penzo, A.; Phillips, T.; Piacentino, G.; Pianori, E.; Pinera, L.; Pitts, K.; Plager, C.; Pondrom, L.; Potamianos, K.; Poukhov, O.; Prokoshin, F.; Pronko, A.; Ptohos, F.; Pueschel, E.; Punzi, G.; Pursley, J.; Rademacker, J.; Rahaman, A.; Ramakrishnan, V.; Ranjan, N.; Redondo, I.; Renton, P.; Renz, M.; Rescigno, M.; Richter, S.; Rimondi, F.; Ristori, L.; Robson, A.; Rodrigo, T.; Rodriguez, T.; Rogers, E.; Rolli, S.; Roser, R.; Rossi, M.; Rossin, R.; Roy, P.; Ruiz, A.; Russ, J.; Rusu, V.; Rutherford, B.; Saarikko, H.; Safonov, A.; Sakumoto, W.; Santi, L.; Sartori, L.; Sato, K.; Saveliev, V.; Savoy-Navarro, A.; Schlabach, P.; Schmidt, A.; Schmidt, E.; Schmidt, M.; Schmidt, M.; Schmitt, M.; Schwarz, T.; Scodellaro, L.; Scribano, A.; Scuri, F.; Sedov, A.; Seidel, S.; Seiya, Y.; Semenov, A.; Sexton-Kennedy, L.; Sforza, F.; Sfyrla, A.; Shalhout, S.; Shears, T.; Shepard, P.; Shimojima, M.; Shiraishi, S.; Shochet, M.; Shon, Y.; Shreyber, I.; Simonenko, A.; Sinervo, P.; Sisakyan, A.; Slaughter, A.; Slaunwhite, J.; Sliwa, K.; Smith, J.; Snider, F.; Snihur, R.; Soha, A.; Somalwar, S.; Sorin, V.; Squillacioti, P.; Stanitzki, M.; St. Denis, R.; Stelzer, B.; Stelzer-Chilton, O.; Stentz, D.; Strologas, J.; Strycker, G.; Suh, J.; Sukhanov, A.; Suslov, I.; Taffard, A.; Takashima, R.; Takeuchi, Y.; Tanaka, R.; Tang, J.; Tecchio, M.; Teng, P.; Thom, J.; Thome, J.; Thompson, G.; Thomson, E.; Tipton, P.; Ttito-Guzmán, P.; Tkaczyk, S.; Toback, D.; Tokar, S.; Tollefson, K.; Tomura, T.; Tonelli, D.; Torre, S.; Torretta, D.; Totaro, P.; Trovato, M.; Tsai, S.-Y.; Tu, Y.; Turini, N.; Ukegawa, F.; Uozumi, S.; van Remortel, N.; Varganov, A.; Vataga, E.; Vázquez, F.; Velev, G.; Vellidis, C.; Vidal, M.; Vila, I.; Vilar, R.; Vogel, M.; Volobouev, I.; Volpi, G.; Wagner, P.; Wagner, R.; Wagner, R.; Wagner, W.; Wagner-Kuhr, J.; Wakisaka, T.; Wallny, R.; Wang, S.; Warburton, A.; Waters, D.; Weinberger, M.; Weinelt, J.; Wester, W.; Whitehouse, B.; Whiteson, D.; Wicklund, A.; Wicklund, E.; Wilbur, S.; Williams, G.; Williams, H.; Wilson, P.; Winer, B.; Wittich, P.; Wolbers, S.; Wolfe, C.; Wolfe, H.; Wright, T.; Wu, X.; Würthwein, F.; Yagil, A.; Yamamoto, K.; Yamaoka, J.; Yang, U.; Yang, Y.; Yao, W.; Yeh, G.; Yi, K.; Yoh, J.; Yorita, K.; Yoshida, T.; Yu, G.; Yu, I.; Yu, S.; Yun, J.; Zanetti, A.; Zeng, Y.; Zhang, X.; Zheng, Y.; Zucchelli, S.en
dc.identifier.orcidhttps://orcid.org/0000-0002-6047-4211
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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