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dc.contributor.authorGutowski, Timothy G.
dc.date.accessioned2011-02-04T13:31:40Z
dc.date.available2011-02-04T13:31:40Z
dc.date.issued2010
dc.identifier.issn1746-9406
dc.identifier.issn1746-9392
dc.identifier.urihttp://hdl.handle.net/1721.1/60894
dc.description.abstractIn this paper, we review the efficiency of both manufacturing processes and systems over recent decades and compare nano-materials technologies in this context. To a first approximation, nano-materials processes appear to be about as efficient as semi-conductor processes. That is, their second law efficiencies are of the order 10(superscript −5), while conventional processes are of order 10(superscript −2). However, many of these processes are early in their development and some opportunities do exist for improvement. At the same time, many aspects of these processes (the need for high purity materials, low yields, and operating conditions far from equilibrium) may make these materials vulnerable to high energy prices.en_US
dc.language.isoen_US
dc.publisherInderscienceen_US
dc.relation.isversionofhttp://dx.doi.org/10.1504/IJNM.2010.034770en_US
dc.rightsAttribution-Noncommercial-Share Alike 3.0 Unporteden_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/en_US
dc.sourceMIT web domainen_US
dc.titleThe efficiency and eco-efficiency of manufacturingen_US
dc.typeArticleen_US
dc.identifier.citationGutowski, Timothy G. "The efficiency and eco-efficiency of manufacturing." International Journal of Nanomanufacturing 6 (2010): 38 - 45.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.approverGutowski, Timothy G.
dc.contributor.mitauthorGutowski, Timothy G.
dc.relation.journalInternational Journal of Nanomanufacturingen_US
dc.eprint.versionAuthor's final manuscript
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsGutowski, Timothy G.en
dc.identifier.orcidhttps://orcid.org/0000-0001-7019-6887
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


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