Microstructure effects for Casimir forces in chiral metamaterials
Author(s)
McCauley, Alexander Patrick; Reid, M. T. Homer; Zhao, Rongkuo; Zhou, Jiangfeng; Rossa, F. S. S.; Dalvit, D. A. R.; Soukoulis, Costas M.; Rodriguez-Wong, Alejandro; Johnson, Steven G; Joannopoulos, John; ... Show more Show less
DownloadMcCauley-2010-Microstructure effec.pdf (224.1Kb)
PUBLISHER_POLICY
Publisher Policy
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Terms of use
Metadata
Show full item recordAbstract
We examine a recent prediction for the chirality dependence of the Casimir force in chiral metamaterials by numerical computation of the forces between the exact microstructures, rather than homogeneous approximations. Although repulsion in the metamaterial regime is rigorously impossible, it is unknown whether a reduction in the attractive force can be achieved through suitable material engineering. We compute the exact force for a chiral bent-cross pattern, as well as forces for an idealized “omega”-particle medium in the dilute approximation and identify the effects of structural inhomogeneity (i.e., proximity forces and anisotropy). We find that these microstructure effects dominate the force for separations where chirality was predicted to have a strong influence. At separations where the homogeneous approximation is valid, in even the most ideal circumstances the effects of chirality are less than 10[superscript −4] of the total force, making them virtually undetectable in experiments.
Date issued
2010-10Department
Massachusetts Institute of Technology. Institute for Soldier Nanotechnologies; Massachusetts Institute of Technology. Department of Mathematics; Massachusetts Institute of Technology. Department of PhysicsJournal
Physical Review B
Publisher
American Physical Society
Citation
McCauley, Alexander P. et al. “Microstructure effects for Casimir forces in chiral metamaterials.” Physical Review B 82.16 (2010): 165108. © 2010 The American Physical Society.
Version: Final published version
ISSN
1098-0121
1550-235X