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dc.contributor.authorSorin, Fabien
dc.contributor.authorFink, Yoel
dc.date.accessioned2011-02-17T13:09:10Z
dc.date.available2011-02-17T13:09:10Z
dc.date.issued2010-09
dc.date.submitted2010-09
dc.identifier.issn0277-786X
dc.identifier.urihttp://hdl.handle.net/1721.1/60968
dc.description.abstractRecent discoveries have enabled the integration of metals, insulators and semiconductors structures into extended length of polymer fibers. This has heralded a novel path and platform towards sensing of different physical quantities such as temperature, chemicals, acoustic waves, and optical signals. The challenges and opportunities associated with this new class of fiber devices will be presented. In particular, we will discuss the materials and fabrication approach of multimaterial fibers. We will then present the latest results on photodetecting fiber sensors patterning to their performance and use in novel sensing designs. We will also introduce the recent development of active fiber devices that integrate a thin ferroelectric polymer layer for acoustic sensing applications. Finally, some aspects of the coming innovation and future prospect of the multimaterial fiber sensing technology will be discussed.en_US
dc.description.sponsorshipUnited States. Army Research Officeen_US
dc.description.sponsorshipUnited States. Defense Advanced Research Projects Agency (DARPA)en_US
dc.description.sponsorshipInstitute for Soldier Nanotechnologiesen_US
dc.description.sponsorshipNational Science Foundation (U.S.) (MRSEC)en_US
dc.language.isoen_US
dc.publisherSPIEen_US
dc.relation.isversionofhttp://dx.doi.org/10.1117/12.868255en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceSPIEen_US
dc.titleMultimaterial fiber sensorsen_US
dc.typeArticleen_US
dc.identifier.citationFabien Sorin and Yoel Fink, "Multimaterial fiber sensors", Proc. SPIE 7653, 765305 (2010)© 2010 COPYRIGHT SPIEen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.approverFink, Yoel
dc.contributor.mitauthorSorin, Fabien
dc.contributor.mitauthorFink, Yoel
dc.relation.journalProceedings of SPIE--the International Society for Optical Engineeringen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dspace.orderedauthorsSorin, Fabien; Fink, Yoelen
dc.identifier.orcidhttps://orcid.org/0000-0001-9752-2283
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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