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What are you trying to tell me? A Bayesian model of how toddlers can simultaneously infer property extension and sampling processes

Author(s)
Gweon, Hyowon; Tenenbaum, Joshua B.; Schulz, Laura E.
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Abstract
Young human learners possess a remarkable ability to make inductive inferences from sparse data. Recent research suggests that children’s generalizations are sensitive to the process by which data are generated (i.e., teacher-driven vs. learner-driven sampling; Xu & Tenenbaum, 2007). In general, sampling process and properties of objects are tightly coupled; knowing how the data were sampled can inform your inference about property extensions, and vice versa. In real-world situations, however, both the extension of novel properties and the sampling process may be ambiguous. These situations commonly arise when children are learning socially from adults. How do children confront the challenge of simultaneously inferring both the property extension and the sampling process from a small amount of data? Here we present a Bayesian model showing how this joint inference problem can be solved. Consistent with the predictions of the model, two behavioral experiments suggest that toddlers (mean: 16 months) can use the relationship between a sample and a population to infer both the sampling process and the extent to which a non-obvious object property should be generalized.
Description
URL to paper on conference site.
Date issued
2009-07
URI
http://hdl.handle.net/1721.1/60989
Department
Massachusetts Institute of Technology. Department of Brain and Cognitive Sciences
Journal
Proceedings of the 31st Annual Meeting of the Cognitive Science Society (CogSci 2009)
Publisher
Cognitive Science Society, Inc.
Citation
Gweon, Hyowon, Joshua B. Tenenbaum, and Laura E. Schulz. "What are you trying to tell me? A Bayesian model of how toddlers can simultaneously infer property extension and sampling processes." Proceedings of the 31st Annual Meeting of the Cognitive Science Society, CogSci 2009, Amsterdam, 29 July-1 August 2009.
Version: Author's final manuscript
ISBN
978-0-9768318-5-3

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