dc.contributor.author | Lan, Yucheng | |
dc.contributor.author | Wang, Hui | |
dc.contributor.author | Wang, Dezhi | |
dc.contributor.author | Chen, Gang | |
dc.contributor.author | Ren, Zhifeng | |
dc.date.accessioned | 2011-03-03T17:57:58Z | |
dc.date.available | 2011-03-03T17:57:58Z | |
dc.date.issued | 2010-06 | |
dc.date.submitted | 2010-05 | |
dc.identifier.issn | 1687-9503 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/61384 | |
dc.description.abstract | New TEM grids coated with ultrathin amorphous Al2O3 films have been developed using atomic layer deposition technique. The amorphous Al2O3 films can withstand temperatures over 600∘C in air and 900∘C in vacuum when the thickness of the Al2O3 film is 2 nm, and up to 1000∘C in air when the thickness is 25 nm, which makes heating TEM grids with nanoparticles up to 1000∘C in air and immediate TEM observation without interrupting the nanoparticles possible. Such coated TEM grids are very much desired for applications in high-temperature high-resolution transmission electron microscopy. | en_US |
dc.language.iso | en_US | |
dc.publisher | Hindawi Pub. Corp. | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1155/2010/279608 | en_US |
dc.rights | Creative Commons Attribution | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by/2.0/ | en_US |
dc.source | Hindawi | en_US |
dc.title | Grids for Applications in High-Temperature High-Resolution Transmission Electron Microscopy | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Lan, Yucheng, et al. “Grids for Applications in High-Temperature High-Resolution Transmission Electron Microscopy,” Journal of Nanotechnology, vol. 2010, Article ID 279608, 6 pages, 2010. © 2010 Hindawi Publishing Corporation. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Mechanical Engineering | en_US |
dc.contributor.approver | Chen, Gang | |
dc.contributor.mitauthor | Chen, Gang | |
dc.relation.journal | Journal of Nanotechnology | en_US |
dc.eprint.version | Final published version | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dspace.orderedauthors | Lan, Yucheng; Wang, Hui; Wang, Dezhi; Chen, Gang; Ren, Zhifeng | en |
dc.identifier.orcid | https://orcid.org/0000-0002-3968-8530 | |
mit.license | PUBLISHER_CC | en_US |
mit.metadata.status | Complete | |