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dc.contributor.authorDavis, John E.
dc.contributor.authorDewey, Dan
dc.contributor.authorFoster, Richard F.
dc.contributor.authorBruccoleri, Alexander Robert
dc.contributor.authorMukherjee, Pran
dc.contributor.authorRobinson, David
dc.contributor.authorHuenemoerder, David P.
dc.contributor.authorSchattenburg, Mark Lee
dc.contributor.authorSchulz, Norbert S.
dc.contributor.authorGuo, L. Jay
dc.contributor.authorKaplan, Alex F.
dc.contributor.authorSchweikart, Russell B.
dc.contributor.authorHeilmann, Ralf K
dc.contributor.authorBautz, Marshall W.
dc.contributor.authorMarshall, Herman
dc.date.accessioned2011-03-04T21:25:02Z
dc.date.available2011-03-04T21:25:02Z
dc.date.issued2010-06
dc.identifier.issn0277-786X
dc.identifier.urihttp://hdl.handle.net/1721.1/61423
dc.description.abstractHigh-resolution spectroscopy at energies below 1 keV covers the lines of C, N, O, Ne and Fe ions, and is central to studies of the Interstellar Medium, the Warm Hot Intergalactic Medium, warm absorption and outflows in Active Galactic Nuclei, coronal emission from stars, etc. The large collecting area, long focal length, and 5 arcsecond half power diameter telescope point-spread function of the International X-ray Observatory will present unprecedented opportunity for a grating spectrometer to address these areas at the forefront of astronomy and astrophysics. We present the current status of a transmission grating spectrometer based on recently developed high-efficiency critical-angle transmission (CAT) gratings that combine the traditional advantages of blazed reflection and transmission gratings. The optical design places light-weight grating arrays close to the telescope mirrors, which maximizes dispersion distance and thus spectral resolution and minimizes demands on mirror performance. It merges features from the Chandra High Energy Transmission Grating Spectrometer and the XMM-Newton Reflection Grating Spectrometer, and provides resolving power R = E/ΔE = 3000 - 5000 (full width half max) and effective area >1000 cm[superscript 2] in the soft x-ray band. We discuss recent results on ray-tracing and optimization of the optical design, instrument configuration studies, and grating fabrication.en_US
dc.description.sponsorshipUnited States. National Aeronautics and Space Administration (NNX07AG98G)en_US
dc.description.sponsorshipUnited States. National Aeronautics and Space Administration (NNX08AI62G)en_US
dc.description.sponsorshipUnited States. National Aeronautics and Space Administration (NNX09AE82A)en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.relation.isversionofhttp://dx.doi.org/10.1117/12.856482en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceSPIEen_US
dc.titleCritical-angle transmission grating spectrometer for high-resolution soft x-ray spectroscopy on the International X-ray Observatoryen_US
dc.typeArticleen_US
dc.identifier.citationHeilmann, Ralf K. et al. “Critical-angle transmission grating spectrometer for high-resolution soft x-ray spectroscopy on the International X-ray Observatory.” Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray. Ed. Monique Arnaud, Stephen S. Murray, & Tadayuki Takahashi. San Diego, California, USA: SPIE, 2010. 77321J-11. © 2010 SPIE.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Aeronautics and Astronauticsen_US
dc.contributor.departmentMIT Kavli Institute for Astrophysics and Space Researchen_US
dc.contributor.approverHeilmann, Ralf K.
dc.contributor.mitauthorHeilmann, Ralf K.
dc.contributor.mitauthorDavis, John E.
dc.contributor.mitauthorDewey, Dan
dc.contributor.mitauthorBautz, Mark W.
dc.contributor.mitauthorFoster, Richard F.
dc.contributor.mitauthorBruccoleri, Alexander Robert
dc.contributor.mitauthorMukherjee, Pran
dc.contributor.mitauthorHuenemoerder, David P.
dc.contributor.mitauthorMarshall, Herman Lee
dc.contributor.mitauthorSchattenburg, Mark Lee
dc.contributor.mitauthorSchulz, Norbert S.
dc.relation.journalProceedings of SPIE--the International Society for Optical Engineering ; v. 7732en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dspace.orderedauthorsHeilmann, Ralf K.; Davis, John E.; Dewey, Daniel; Bautz, Mark W.; Foster, Rick; Bruccoleri, Alex; Mukherjee, Pran; Robinson, David; Huenemoerder, David P.; Marshall, Herman L.; Schattenburg, Mark L.; Schulz, Norbert S.; Guo, L. Jay; Kaplan, Alex F.; Schweikart, Russell B.en
dc.identifier.orcidhttps://orcid.org/0000-0001-6932-2612
dc.identifier.orcidhttps://orcid.org/0000-0002-1379-4482
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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