MIT Libraries logoDSpace@MIT

MIT
View Item 
  • DSpace@MIT Home
  • MIT Open Access Articles
  • MIT Open Access Articles
  • View Item
  • DSpace@MIT Home
  • MIT Open Access Articles
  • MIT Open Access Articles
  • View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.

Optimal quantization of random measurements in compressed sensing

Author(s)
Sun, John Z.
Thumbnail
DownloadSun-2009-Optimal quantization of random measurements in compressed sensing.pdf (1.023Mb)
PUBLISHER_POLICY

Publisher Policy

Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.

Terms of use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Metadata
Show full item record
Abstract
Quantization is an important but often ignored consideration in discussions about compressed sensing. This paper studies the design of quantizers for random measurements of sparse signals that are optimal with respect to mean-squared error of the lasso reconstruction. We utilize recent results in high-resolution functional scalar quantization and homotopy continuation to approximate the optimal quantizer. Experimental results compare this quantizer to other practical designs and show a noticeable improvement in the operational distortion-rate performance.
Date issued
2009-07
URI
http://hdl.handle.net/1721.1/61623
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science; Massachusetts Institute of Technology. Research Laboratory of Electronics
Journal
IEEE International Symposium on Information Theory.
Publisher
Institute of Electrical and Electronics Engineers
Citation
Sun, J.Z., and V.K. Goyal. “Optimal quantization of random measurements in compressed sensing.” Information Theory, 2009. ISIT 2009. IEEE International Symposium on. 2009. 6-10. © 2009, IEEE
Version: Final published version
Other identifiers
INSPEC Accession Number: 10842044
ISBN
978-1-4244-4312-3

Collections
  • MIT Open Access Articles

Browse

All of DSpaceCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

My Account

Login

Statistics

OA StatisticsStatistics by CountryStatistics by Department
MIT Libraries
PrivacyPermissionsAccessibilityContact us
MIT
Content created by the MIT Libraries, CC BY-NC unless otherwise noted. Notify us about copyright concerns.