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Passive Reduced Order Modeling of Multiport Interconnects via Semidefinite Programming

dc.contributor.authorMahmood, Zohaib
dc.contributor.authorBond, Bradley N.
dc.contributor.authorEl-Moselhy, Tarek Ali
dc.contributor.authorMegretski, Alexandre
dc.contributor.authorDaniel, Luca
dc.date.accessioned2011-03-11T16:58:33Z
dc.date.available2011-03-11T16:58:33Z
dc.date.issued2010-04
dc.date.submitted2010-03
dc.identifier.isbn978-1-4244-7054-9
dc.identifier.issn1530-1591
dc.identifier.otherINSPEC Accession Number: 11283370
dc.identifier.urihttp://hdl.handle.net/1721.1/61675
dc.description.abstractIn this paper we present a passive reduced order modeling algorithm for linear multiport interconnect structures. The proposed technique uses rational fitting via semidefinite programming to identify a passive transfer matrix from given frequency domain data samples. Numerical results are presented for a power distribution grid and an array of inductors, and the proposed approach is compared to two existing rational fitting techniques.en_US
dc.description.sponsorshipSemiconductor Research Corporationen_US
dc.description.sponsorshipUnited States. Defense Advanced Research Projects Agencyen_US
dc.description.sponsorshipSemiconductor Research Corporation. Focus Center Research Programen_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titlePassive Reduced Order Modeling of Multiport Interconnects via Semidefinite Programmingen_US
dc.typeArticleen_US
dc.identifier.citationMahmood, Z., et al. “Passive reduced order modeling of multiport interconnects via semidefinite programming.” Design, Automation & Test in Europe Conference & Exhibition, 2010. 622-625. ©2010 IEEE.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Aeronautics and Astronauticsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.approverDaniel, Luca
dc.contributor.mitauthorDaniel, Luca
dc.contributor.mitauthorMahmood, Zohaib
dc.contributor.mitauthorBond, Bradley N.
dc.contributor.mitauthorEl-Moselhy, Tarek Ali
dc.contributor.mitauthorMegretski, Alexandre
dc.relation.journalDesign, Automation & Test in Europe Conference & Exhibition, 2010en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dspace.orderedauthorsMahmood, Zohaib; Bond, Brad; Moselhy, Tarek; Megretski, Alexandre; Daniel, Luca
dc.identifier.orcidhttps://orcid.org/0000-0002-5880-3151
dc.identifier.orcidhttps://orcid.org/0000-0001-9088-0205
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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