dc.contributor.author | Liu, Ce | |
dc.contributor.author | Yuen, Jenny | |
dc.contributor.author | Torralba, Antonio | |
dc.date.accessioned | 2011-03-28T18:42:05Z | |
dc.date.available | 2011-03-28T18:42:05Z | |
dc.date.issued | 2010-08 | |
dc.identifier.issn | 0162-8828 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/61983 | |
dc.description.abstract | While image alignment has been studied in different areas of computer vision for decades, aligning images depicting different scenes remains a challenging problem. Analogous to optical flow, where an image is aligned to its temporally adjacent frame, we propose SIFT flow, a method to align an image to its nearest neighbors in a large image corpus containing a variety of scenes. The SIFT flow algorithm consists of matching densely sampled, pixelwise SIFT features between two images while preserving spatial discontinuities. The SIFT features allow robust matching across different scene/object appearances, whereas the discontinuity-preserving spatial model allows matching of objects located at different parts of the scene. Experiments show that the proposed approach robustly aligns complex scene pairs containing significant spatial differences. Based on SIFT flow, we propose an alignment-based large database framework for image analysis and synthesis, where image information is transferred from the nearest neighbors to a query image according to the dense scene correspondence. This framework is demonstrated through concrete applications such as motion field prediction from a single image, motion synthesis via object transfer, satellite image registration, and face recognition. | en_US |
dc.description.sponsorship | Royal Dutch-Shell Group | en_US |
dc.description.sponsorship | United States. National Geospatial-Intelligence Agency (NGA NEGI-1582-04-0004) | en_US |
dc.description.sponsorship | United States. Army Research Office. Multidisciplinary University Research Initiative (MURI grant N00014- 06-1-0734) | en_US |
dc.description.sponsorship | National Science Foundation (U.S.) (Career award IIS 0747120) | en_US |
dc.description.sponsorship | National Science Foundation (U.S.) (Contract IIS-0413232) | en_US |
dc.description.sponsorship | National Defense Science and Engineering Graduate Fellowship | en_US |
dc.description.sponsorship | Xerox Fellowship Program | en_US |
dc.description.sponsorship | Foxconn | en_US |
dc.description.sponsorship | Microsoft Corporation | en_US |
dc.description.sponsorship | Google (Firm) | en_US |
dc.language.iso | en_US | |
dc.publisher | Institute of Electrical and Electronics Engineers / IEEE Computer Society | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1109/TPAMI.2010.147 | en_US |
dc.rights | Creative Commons Attribution-Noncommercial-Share Alike 3.0 | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/3.0/ | en_US |
dc.source | MIT web domain | en_US |
dc.title | SIFT Flow: Dense Correspondence across Scenes and its Applications | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Liu, Ce, Jenny Yuen, and Antonio Torralba. “SIFT Flow: Dense Correspondence across Scenes and Its Applications.” Pattern Analysis and Machine Intelligence, IEEE Transactions On 33.5 (2011) : 978-994. Copyright © 2011, IEEE | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
dc.contributor.approver | Torralba, Antonio | |
dc.contributor.mitauthor | Yuen, Jenny | |
dc.contributor.mitauthor | Torralba, Antonio | |
dc.relation.journal | IEEE transactions on pattern analysis and machine intelligence. | en_US |
dc.eprint.version | Author's final manuscript | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dspace.orderedauthors | Liu, Ce; Yuen, Jenny; Torralba, Antonio | en |
dc.identifier.orcid | https://orcid.org/0000-0003-4915-0256 | |
mit.license | OPEN_ACCESS_POLICY | en_US |
mit.metadata.status | Complete | |