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dc.contributor.authorHu, Juejun
dc.contributor.authorLin, Shiyun
dc.contributor.authorKimerling, Lionel C.
dc.contributor.authorCrozier, Kenneth
dc.date.accessioned2011-05-24T14:00:58Z
dc.date.available2011-05-24T14:00:58Z
dc.date.issued2009-08
dc.date.submitted2010-11
dc.identifier.issn1050-2947
dc.identifier.issn1094-1622
dc.identifier.urihttp://hdl.handle.net/1721.1/63089
dc.description.abstractWe theoretically investigate the opto-mechanical interactions between a dielectric nanoparticle and the resonantly enhanced optical field inside a high Q, small-mode-volume optical cavity. We develop an analytical method based on open system analysis to account for the resonant perturbation due to particle introduction and predict trapping potential in good agreement with three-dimensional (3D) finite-difference time-domain (FDTD) numerical simulations. Strong size-dependent trapping dynamics distinctly different from free-space optical tweezers arise as a consequence of the finite cavity perturbation. We illustrate single nanoparticle trapping from an ensemble of monodispersed particles based on size-dependent trapping dynamics. We further discover that the failure of the conventional dipole approximation in the case of resonant cavity trapping originates from a new perturbation interaction mechanism between trapped particles and spatially localized photons.en_US
dc.language.isoen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevA.82.053819en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleOptical trapping of dielectric nanoparticles in resonant cavitiesen_US
dc.typeArticleen_US
dc.identifier.citationHu, Juejun et al. “Optical Trapping of Dielectric Nanoparticles in Resonant Cavities.” Physical Review A 82.5 (2010) : 053819. © 2010 The American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Microphotonics Centeren_US
dc.contributor.approverKimerling, Lionel C.
dc.contributor.mitauthorHu, Juejun
dc.contributor.mitauthorKimerling, Lionel C.
dc.relation.journalPhysical Review Aen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsHu, Juejun; Lin, Shiyun; Kimerling, Lionel; Crozier, Kennethen
dc.identifier.orcidhttps://orcid.org/0000-0002-7233-3918
dc.identifier.orcidhttps://orcid.org/0000-0002-3913-6189
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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