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dc.contributor.authorBhattacharyya, Arnab
dc.contributor.authorChen, Victor
dc.contributor.authorSudan, Madhu
dc.contributor.authorXie, Ning
dc.date.accessioned2011-05-26T14:32:02Z
dc.date.available2011-05-26T14:32:02Z
dc.date.issued2010-10
dc.identifier.isbn978-3-642-16366-1
dc.identifier.issn0302-9743
dc.identifier.issn1611-3349
dc.identifier.urihttp://hdl.handle.net/1721.1/63125
dc.description.abstractThe rich collection of successes in property testing raises a natural question: Why are so many different properties turning out to be locally testable? Are there some broad “features” of properties that make them testable? Kaufman and Sudan (STOC 2008) proposed the study of the relationship between the invariances satisfied by a property and its testability. Particularly, they studied properties that were invariant under linear transformations of the domain and gave a characterization of testability in certain settings. However, the properties that they examined were also linear. This led us to investigate linear-invariant properties that are not necessarily linear. Here we describe some of the resulting works which consider natural linear-invariant properties, specifically properties that are described by forbidden patterns of values that a function can take, and show testability under various settings.en_US
dc.language.isoen_US
dc.publisherSpringer Berlin / Heidelbergen_US
dc.relation.isversionofhttp://dx.doi.org/10.1007/978-3-642-16367-8_18en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alike 3.0en_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/en_US
dc.sourceMIT web domainen_US
dc.titleTesting linear-invariant non-linear properties: A short reporten_US
dc.typeArticleen_US
dc.identifier.citationBhattacharyya, Arnab et al. “Testing Linear-Invariant Non-linear Properties: A Short Report.” Property Testing. Springer Berlin / Heidelberg, 2011. 260-268.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.approverSudan, Madhu
dc.contributor.mitauthorBhattacharyya, Arnab
dc.contributor.mitauthorSudan, Madhu
dc.contributor.mitauthorXie, Ning
dc.relation.journalProperty Testingen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsBhattacharyya, Arnab; Chen, Victor; Sudan, Madhu; Xie, Ningen
mit.licenseOPEN_ACCESS_POLICYen_US


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