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Quantum ghost imaging through turbulence

dc.contributor.authorDixon, P. Ben
dc.contributor.authorHowland, Gregory A.
dc.contributor.authorChan, Kam Wai Clifford
dc.contributor.authorO'Sullivan-Hale, Colin
dc.contributor.authorRodenburg, Brandon
dc.contributor.authorHardy, Nicholas David
dc.contributor.authorShapiro, Jeffrey H.
dc.contributor.authorSimon, D. S.
dc.contributor.authorSergienko, A. V.
dc.contributor.authorBoyd, R. W.
dc.contributor.authorHowell, John C.
dc.date.accessioned2011-08-23T15:52:29Z
dc.date.available2011-08-23T15:52:29Z
dc.date.issued2011-05
dc.date.submitted2011-02
dc.identifier.issn1050-2947
dc.identifier.issn1094-1622
dc.identifier.urihttp://hdl.handle.net/1721.1/65352
dc.description.abstractWe investigate the effect of turbulence on quantum ghost imaging. We use entangled photons and demonstrate that for a specific experimental configuration the effect of turbulence can be greatly diminished. By decoupling the entangled photon source from the ghost-imaging central image plane, we are able to dramatically increase the ghost-image quality. When imaging a test pattern through turbulence, this method increases the imaged pattern visibility from V=0.15±0.04 to 0.42±0.04.en_US
dc.description.sponsorshipUnited States. Defense Advanced Research Projects Agency (DARPA DSO InPho Grant No. W911NF-10-1-0404)en_US
dc.description.sponsorshipUnited States. Army Research Office (USARO MURI Grant No. W911NF-05-1-0197)en_US
dc.language.isoen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevA.83.051803en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleQuantum ghost imaging through turbulenceen_US
dc.typeArticleen_US
dc.identifier.citationDixon, P. et al. “Quantum Ghost Imaging Through Turbulence.” Physical Review A 83.5 (2011) : 051803 © 2011 American Physical Society.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.approverShapiro, Jeffrey H.
dc.contributor.mitauthorShapiro, Jeffrey H.
dc.contributor.mitauthorHardy, Nicholas David
dc.relation.journalPhysical Review Aen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsDixon, P.; Howland, Gregory; Chan, Kam; O’Sullivan-Hale, Colin; Rodenburg, Brandon; Hardy, Nicholas; Shapiro, Jeffrey; Simon, D. S.; Sergienko, A. V.; Boyd, R. W.; Howell, Johnen
dc.identifier.orcidhttps://orcid.org/0000-0002-6094-5861
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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