Highlighted depth-of-field photography: Shining light on focus
Author(s)
Kim, Jaewon; Horstmeyer, Roarke William; Kim, Ig-Jae; Raskar, Ramesh
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We present a photographic method to enhance intensity differences between
objects at varying distances from the focal plane. By combining a unique
capture procedure with simple image processing techniques, the detected
brightness of an object is decreased proportional to its degree of defocus. A
camera-projector system casts distinct grid patterns onto a scene to generate
a spatial distribution of point reflections. These point reflections relay a
relative measure of defocus that is utilized in postprocessing to generate a
highlighted DOF photograph. Trade-offs between three different projectorprocessing
pairs are analyzed, and a model is developed to help describe a
new intensity-dependent depth of field that is controlled by the pattern of
illumination. Results are presented for a primary single snapshot design as
well as a scanning method and a comparison method. As an application,
automatic matting results are presented.
Date issued
2011-05Department
Massachusetts Institute of Technology. Media Laboratory; Program in Media Arts and Sciences (Massachusetts Institute of Technology)Journal
ACM transactions on graphics
Publisher
Association for Computing Machinery
Citation
Kim, Jaewon et al. “Highlighted depth-of-field photography: shining light on focus.” ACM Transactions on Graphics 30, 3, (May 2011): 1-9. Copyright © 2011, Association for Computing Machinery, Inc.
Version: Author's final manuscript
ISSN
0730-0301