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dc.contributor.authorLee, Kayi
dc.contributor.authorLee, Hyang-Won
dc.contributor.authorModiano, Eytan H.
dc.date.accessioned2011-09-29T22:26:24Z
dc.date.available2011-09-29T22:26:24Z
dc.date.issued2010-03
dc.identifier.isbn978-1-4244-5836-3
dc.identifier.issn0743-166X
dc.identifier.otherINSPEC Accession Number: 11286922
dc.identifier.urihttp://hdl.handle.net/1721.1/66124
dc.description.abstractWe consider network reliability in layered networks where the lower layer experiences random link failures. In layered networks, each failure at the lower layer may lead to multiple failures at the upper layer. We generalize the classical polynomial expression for network reliability to the multi-layer setting. Using random sampling techniques, we develop polynomial time approximation algorithms for the failure polynomial. Our approach gives an approximate expression for reliability as a function of the link failure probability, eliminating the need to resample for different values of the failure probability. Furthermore, it gives insight on how the routings of the logical topology on the physical topology impact network reliability. We show that maximizing the min cut of the (layered) network maximizes reliability in the low failure probability regime. Based on this observation, we develop algorithms for routing the logical topology to maximize reliability.en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Grant CNS-0626781)en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Grant CNS-0830961)en_US
dc.description.sponsorshipUnited States. Defense Threat Reduction Agency (Grant HDTRA1-07-1-0004)en_US
dc.description.sponsorshipUnited States. Defense Threat Reduction Agency (Grant HDTRA-09-1-005)en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/INFCOM.2010.5461985en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleReliability in layered networks with random link failuresen_US
dc.typeArticleen_US
dc.identifier.citationLee, Kayi, Hyang-Won Lee, and Eytan Modiano. “Reliability in Layered Networks with Random Link Failures.” IEEE INFOCOM, 2010. 1-9. Web. 29 Sept. 2011.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Aeronautics and Astronauticsen_US
dc.contributor.approverModiano, Eytan H.
dc.contributor.mitauthorLee, Kayi
dc.contributor.mitauthorLee, Hyang-Won
dc.contributor.mitauthorModiano, Eytan H.
dc.relation.journalIEEE INFOCOM proceedings 2010en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dspace.orderedauthorsLee, Kayi; Lee, Hyang-Won; Modiano, Eytanen
dc.identifier.orcidhttps://orcid.org/0000-0001-8238-8130
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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