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dc.contributor.authorBalewski, Jan T.
dc.contributor.authorBetancourt, Michael Joseph
dc.contributor.authorCorliss, Ross Cameron
dc.contributor.authorHays-Wehle, James Prewitt
dc.contributor.authorKocoloski, Adam Philip
dc.contributor.authorLeight, William Axel
dc.contributor.authorSakuma, Tai
dc.contributor.authorSeele, Joseph Patrick
dc.contributor.authorSurrow, Bernd
dc.contributor.authorMilner, Richard G
dc.contributor.authorRedwine, Robert P
dc.contributor.authorvan Nieuwenhuizen, Gerrit J
dc.contributor.authorWalker, Matthew H
dc.date.accessioned2011-09-30T14:32:41Z
dc.date.available2011-09-30T14:32:41Z
dc.date.issued2011-03
dc.date.submitted2010-08
dc.identifier.issn0556-2813
dc.identifier.urihttp://hdl.handle.net/1721.1/66134
dc.description.abstractIdentified charged pion, kaon, and proton spectra are used to explore the system size dependence of bulk freeze-out properties in Cu+Cu collisions at [sqrt]sNN=200 and 62.4 GeV. The data are studied with hydrodynamically motivated blast-wave and statistical model frameworks in order to characterize the freeze-out properties of the system. The dependence of freeze-out parameters on beam energy and collision centrality is discussed. Using the existing results from Au + Au and pp collisions, the dependence of freeze-out parameters on the system size is also explored. This multidimensional systematic study furthers our understanding of the QCD phase diagram revealing the importance of the initial geometrical overlap of the colliding ions. The analysis of Cu+Cu collisions expands the system size dependence studies from Au+Au data with detailed measurements in the smaller system. The systematic trends of the bulk freeze-out properties of charged particles is studied with respect to the total charged particle multiplicity at midrapidity, exploring the influence of initial state effects.en_US
dc.description.sponsorshipNational Science Foundation (U.S.)en_US
dc.description.sponsorshipUnited States. Dept. of Energyen_US
dc.description.sponsorshipAlfred P. Sloan Foundationen_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevC.83.034910en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleScaling properties at freeze-out in relativistic heavy-ion collisionsen_US
dc.typeArticleen_US
dc.identifier.citationAggarwal, M. et al. “Scaling properties at freeze-out in relativistic heavy-ion collisions.” Physical Review C 83 (2011). ©2011 American Physical Society.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Laboratory for Nuclear Scienceen_US
dc.contributor.approverSurrow, Bernd
dc.contributor.mitauthorBalewski, Jan T.
dc.contributor.mitauthorBetancourt, Michael Joseph
dc.contributor.mitauthorCorliss, Ross Cameron
dc.contributor.mitauthorHays-Wehle, James Prewitt
dc.contributor.mitauthorKocoloski, Adam Philip
dc.contributor.mitauthorLeight, William Axel
dc.contributor.mitauthorMilner, Richard G.
dc.contributor.mitauthorRedwine, Robert P.
dc.contributor.mitauthorSakuma, Tai
dc.contributor.mitauthorSeele, Joseph Patrick
dc.contributor.mitauthorSurrow, Bernd
dc.contributor.mitauthorvan Nieuwenhuizen, Gerrit Jan
dc.contributor.mitauthorWalker, M.
dc.relation.journalPhysical Review Cen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsAggarwal, M.; Ahammed, Z.; Alakhverdyants, A.; Alekseev, I.; Alford, J.; Anderson, B.; Anson, C.; Arkhipkin, D.; Averichev, G.; Balewski, J.; Barnby, L.; Beavis, D.; Bellwied, R.; Betancourt, M.; Betts, R.; Bhasin, A.; Bhati, A.; Bichsel, H.; Bielcik, J.; Bielcikova, J.; Biritz, B.; Bland, L.; Borowski, W.; Bouchet, J.; Braidot, E.; Brandin, A.; Bridgeman, A.; Bruna, E.; Bueltmann, S.; Bunzarov, I.; Burton, T.; Cai, X.; Caines, H.; Calderón de la Barca Sánchez, M.; Cebra, D.; Cendejas, R.; Cervantes, M.; Chajecki, Z.; Chaloupka, P.; Chattopadhyay, S.; Chen, H.; Chen, J.; Chen, J.; Cheng, J.; Cherney, M.; Chikanian, A.; Choi, K.; Christie, W.; Chung, P.; Codrington, M.; Corliss, R.; Cramer, J.; Crawford, H.; Dash, S.; Davila Leyva, A.; De Silva, L.; Debbe, R.; Dedovich, T.; Derevschikov, A.; Derradi de Souza, R.; Didenko, L.; Djawotho, P.; Dogra, S.; Dong, X.; Drachenberg, J.; Draper, J.; Dunlop, J.; Dutta Mazumdar, M.; Efimov, L.; Elnimr, M.; Engelage, J.; Eppley, G.; Erazmus, B.; Estienne, M.; Eun, L.; Evdokimov, O.; Fatemi, R.; Fedorisin, J.; Fersch, R.; Finch, E.; Fine, V.; Fisyak, Y.; Gagliardi, C.; Gangadharan, D.; Ganti, M.; Geromitsos, A.; Geurts, F.; Ghosh, P.; Gorbunov, Y.; Gordon, A.; Grebenyuk, O.; Grosnick, D.; Guertin, S.; Gupta, A.; Guryn, W.; Haag, B.; Hamed, A.; Han, L-X.; Harris, J.; Hays-Wehle, J.; Heinz, M.; Heppelmann, S.; Hirsch, A.; Hjort, E.; Hoffmann, G.; Hofman, D.; Hollis, R.; Huang, B.; Huang, H.; Humanic, T.; Huo, L.; Igo, G.; Iordanova, A.; Jacobs, P.; Jacobs, W.; Jena, C.; Jin, F.; Joseph, J.; Judd, E.; Kabana, S.; Kang, K.; Kapitan, J.; Kauder, K.; Keane, D.; Kechechyan, A.; Kettler, D.; Kikola, D.; Kiryluk, J.; Kisiel, A.; Kizka, V.; Klein, S.; Knospe, A.; Kocoloski, A.; Koetke, D.; Kollegger, T.; Konzer, J.; Koralt, I.; Koroleva, L.; Korsch, W.; Kotchenda, L.; Kouchpil, V.; Kravtsov, P.; Krueger, K.; Krus, M.; Kumar, L.; Kurnadi, P.; Lamont, M.; Landgraf, J.; LaPointe, S.; Lauret, J.; Lebedev, A.; Lednicky, R.; Lee, C-H.; Lee, J.; Leight, W.; LeVine, M.; Li, C.; Li, L.; Li, N.; Li, W.; Li, X.; Li, X.; Li, Y.; Li, Z.; Lisa, M.; Liu, F.; Liu, H.; Liu, J.; Ljubicic, T.; Llope, W.; Longacre, R.; Love, W.; Lu, Y.; Lukashov, E.; Luo, X.; Ma, G.; Ma, Y.; Mahapatra, D.; Majka, R.; Mall, O.; Mangotra, L.; Manweiler, R.; Margetis, S.; Markert, C.; Masui, H.; Matis, H.; Matulenko, Yu.; McDonald, D.; McShane, T.; Meschanin, A.; Milner, R.; Minaev, N.; Mioduszewski, S.; Mitrovski, M.; Mohanty, B.; Mondal, M.; Morozov, B.; Morozov, D.; Munhoz, M.; Naglis, M.; Nandi, B.; Nayak, T.; Netrakanti, P.; Ng, M.; Nogach, L.; Nurushev, S.; Odyniec, G.; Ogawa, A.; Ohlson, A.; Okorokov, V.; Oldag, E.; Olson, D.; Pachr, M.; Page, B.; Pal, S.; Pandit, Y.; Panebratsev, Y.; Pawlak, T.; Peitzmann, T.; Perkins, C.; Peryt, W.; Phatak, S.; Pile, P.; Planinic, M.; Ploskon, M.; Pluta, J.; Plyku, D.; Poljak, N.; Poskanzer, A.; Potukuchi, B.; Powell, C.; Prindle, D.; Pruneau, C.; Pruthi, N.; Pujahari, P.; Putschke, J.; Qiu, H.; Raniwala, R.; Raniwala, S.; Ray, R.; Redwine, R.; Reed, R.; Ritter, H.; Roberts, J.; Rogachevskiy, O.; Romero, J.; Rose, A.; Ruan, L.; Sakai, S.; Sakrejda, I.; Sakuma, T.; Salur, S.; Sandweiss, J.; Sangaline, E.; Schambach, J.; Scharenberg, R.; Schmah, A.; Schmitz, N.; Schuster, T.; Seele, J.; Seger, J.; Selyuzhenkov, I.; Seyboth, P.; Shahaliev, E.; Shao, M.; Sharma, M.; Shi, S.; Sichtermann, E.; Simon, F.; Singaraju, R.; Skoby, M.; Smirnov, N.; Sorensen, P.; Spinka, H.; Srivastava, B.; Stanislaus, T.; Staszak, D.; Stevens, J.; Stock, R.; Strikhanov, M.; Stringfellow, B.; Suaide, A.; Suarez, M.; Subba, N.; Sumbera, M.; Sun, X.; Sun, Y.; Sun, Z.; Surrow, B.; Svirida, D.; Symons, T.; Szanto de Toledo, A.; Takahashi, J.; Tang, A.; Tang, Z.; Tarini, L.; Tarnowsky, T.; Thein, D.; Thomas, J.; Tian, J.; Timmins, A.; Timoshenko, S.; Tlusty, D.; Tokarev, M.; Tram, V.; Trentalange, S.; Tribble, R.; Tsai, O.; Ullrich, T.; Underwood, D.; Van Buren, G.; van Leeuwen, M.; van Nieuwenhuizen, G.; Vanfossen, J.; Varma, R.; Vasconcelos, G.; Vasiliev, A.; Videbæk, F.; Viyogi, Y.; Vokal, S.; Voloshin, S.; Wada, M.; Walker, M.; Wang, F.; Wang, G.; Wang, H.; Wang, J.; Wang, Q.; Wang, X.; Wang, Y.; Webb, G.; Webb, J.; Westfall, G.; Jr., C.; Wieman, H.; Wissink, S.; Witt, R.; Wu, Y.; Xie, W.; Xu, H.; Xu, N.; Xu, Q.; Xu, W.; Xu, Y.; Xu, Z.; Xue, L.; Yang, Y.; Yepes, P.; Yip, K.; Yoo, I-K.; Yue, Q.; Zawisza, M.; Zbroszczyk, H.; Zhan, W.; Zhang, J.; Zhang, S.; Zhang, W.; Zhang, X.; Zhang, Y.; Zhang, Z.; Zhao, J.; Zhong, C.; Zhou, W.; Zhu, X.; Zhu, Y.; Zoulkarneev, R.; Zoulkarneeva, Y.en
dc.identifier.orcidhttps://orcid.org/0000-0002-5515-4563
dc.identifier.orcidhttps://orcid.org/0000-0001-5839-707X
dc.identifier.orcidhttps://orcid.org/0000-0002-0031-1963
dc.identifier.orcidhttps://orcid.org/0000-0002-9107-6312
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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