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dc.contributor.authorKüng, Bruno
dc.contributor.authorGustavsson, Simon
dc.contributor.authorChoi, Theodore
dc.contributor.authorShorubalko, Ivan
dc.contributor.authorPfäffli, Oliver
dc.contributor.authorHassler, Fabian
dc.contributor.authorBlatter, Gianni
dc.contributor.authorReinwald, Matthias
dc.contributor.authorWegscheider, Werner
dc.contributor.authorSchön, Silke
dc.contributor.authorIhn, Thomas
dc.contributor.authorEnsslin, Klaus
dc.date.accessioned2011-10-19T17:23:40Z
dc.date.available2011-10-19T17:23:40Z
dc.date.issued2010-06
dc.date.submitted2010-06
dc.identifier.issn1099-4300
dc.identifier.urihttp://hdl.handle.net/1721.1/66493
dc.description.abstractCharge sensing with quantum point-contacts (QPCs) is a technique widely used in semiconductor quantum-dot research. Understanding the physics of this measurement process, as well as finding ways of suppressing unwanted measurement back-action, are therefore both desirable. In this article, we present experimental studies targeting these two goals. Firstly, we measure the effect of a QPC on electron tunneling between two InAs quantum dots, and show that a model based on the QPC’s shot-noise can account for it. Secondly, we discuss the possibility of lowering the measurement current (and thus the back-action) used for charge sensing by correlating the signals of two independent measurement channels. The performance of this method is tested in a typical experimental setup.en_US
dc.description.sponsorshipSwiss National Science Foundationen_US
dc.language.isoen_US
dc.publisherMDPI Publishingen_US
dc.relation.isversionofhttp://dx.doi.org/10.3390/e12071721en_US
dc.rightsCreative Commons Attribution 3.0en_US
dc.rights.urihttp://creativecommons.org/licenses/by/3.0en_US
dc.sourceMDPIen_US
dc.titleMeasurement Back-Action in Quantum Point-Contact Charge Sensingen_US
dc.typeArticleen_US
dc.identifier.citationKüng, Bruno et al. “Measurement Back-Action in Quantum Point-Contact Charge Sensing.” Entropy 12 (2010): 1721-1732. Web. 19 Oct. 2011. © 2011 MDPI Publishingen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.approverGustavsson, Simon
dc.contributor.mitauthorGustavsson, Simon
dc.relation.journalEntropyen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsKüng, Bruno; Gustavsson, Simon; Choi, Theodore; Shorubalko, Ivan; Pfäffli, Oliver; Hassler, Fabian; Blatter, Gianni; Reinwald, Matthias; Wegscheider, Werner; Schön, Silke; Ihn, Thomas; Ensslin, Klausen
dc.identifier.orcidhttps://orcid.org/0000-0002-7069-1025
mit.licensePUBLISHER_CCen_US
mit.metadata.statusComplete


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