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dc.contributor.authorSun, Ruoshi
dc.contributor.authorChan, Maria K.
dc.contributor.authorKang, ShinYoung
dc.contributor.authorCeder, Gerbrand
dc.date.accessioned2011-11-30T18:00:09Z
dc.date.available2011-11-30T18:00:09Z
dc.date.issued2011-07
dc.date.submitted2011-05
dc.identifier.issn1098-0121
dc.identifier.issn1550-235X
dc.identifier.urihttp://hdl.handle.net/1721.1/67315
dc.description.abstractThe stoichiometry and ubiquitous observation of p-type conductivity of synthetic pyrite FeS[subscript 2] thin films are investigated via first-principles computations of native (vacancies, interstitials, antisites) and extrinsic (O[subscript S], O[subscript i]) point defects. Native defects have high formation energies and are predicted to occur in low concentrations within the Fe- and S-rich limits, showing that pyrite should be intrinsically stoichiometric. Under sufficiently oxidizing conditions, O[subscript S] becomes the most dominant defect type and induces p-type conductivity. At the experimental oxygen impurity concentration, the hole concentration is predicted to be O(10[superscript 19]) cm[superscript −3], in agreement with Hall measurements reported in the literature. Therefore, we attribute the unintentional p-type conductivity of pyrite to oxygen impurities and propose that improvements in device performance may be achieved under more reducing conditions.en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Grant No. TG-DMR970008S)en_US
dc.language.isoen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevB.84.035212en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleIntrinsic stoichiometry and oxygen-induced p-type conductivity of pyrite FeS2en_US
dc.typeArticleen_US
dc.identifier.citationSun, Ruoshi et al. “Intrinsic stoichiometry and oxygen-induced p-type conductivity of pyrite FeS_{2}.” Physical Review B 84 (2011): n. pag. Web. 30 Nov. 2011. © 2011 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.approverCeder, Gerbrand
dc.contributor.mitauthorSun, Ruoshi
dc.contributor.mitauthorChan, Maria K.
dc.contributor.mitauthorKang, ShinYoung
dc.contributor.mitauthorCeder, Gerbrand
dc.relation.journalPhysical Review Ben_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsSun, Ruoshi; Chan, M. K. Y.; Kang, ShinYoung; Ceder, G.en
dc.identifier.orcidhttps://orcid.org/0000-0002-6833-3480
dc.identifier.orcidhttps://orcid.org/0000-0003-0333-6565
dspace.mitauthor.errortrue
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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