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dc.contributor.authorKim, Dohoon
dc.contributor.authorTsai, Li-Huei
dc.date.accessioned2011-12-01T18:16:55Z
dc.date.available2011-12-01T18:16:55Z
dc.date.issued2009-08
dc.identifier.issn0077-8923
dc.identifier.urihttp://hdl.handle.net/1721.1/67340
dc.description.abstractAberrant cell cycle activity and DNA damage have been observed in neurons in association with various neurodegenerative conditions. While there is strong evidence for a causative role for these events in neurotoxicity, it is unclear how they are triggered and why they are toxic. Here, we introduce a brief background of the current view on cell cycle activity and DNA damage in neurons and speculate on their relevance to neuronal survival. Furthermore, we suggest that the two events may be triggered in common by deregulation of fundamental processes, such as chromatin modulation, which are required for maintaining both DNA integrity and proper regulation of cell cycle gene expression.en_US
dc.language.isoen_US
dc.publisherNew York Academy of Sciencesen_US
dc.relation.isversionofhttp://dx.doi.org/10.1111/j.1749-6632.2009.04105.xen_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceBlackwellen_US
dc.titleLinking Cell Cycle Reentry and DNA Damage in Neurodegenerationen_US
dc.typeArticleen_US
dc.identifier.citationKim, Dohoon, and Li-Huei Tsai. “Linking Cell Cycle Reentry and DNA Damage in Neurodegeneration.” Annals of the New York Academy of Sciences 1170 (2009): 674-679. Web. 1 Dec. 2011. © 2009 New York Academy of Sciencesen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Brain and Cognitive Sciencesen_US
dc.contributor.departmentPicower Institute for Learning and Memoryen_US
dc.contributor.approverTsai, Li-Huei
dc.contributor.mitauthorKim, Dohoon
dc.contributor.mitauthorTsai, Li-Huei
dc.relation.journalAnnals of the New York Academy of Sciencesen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsKim, Dohoon; Tsai, Li-Hueien
dc.identifier.orcidhttps://orcid.org/0000-0003-1262-0592
mit.licenseMIT_AMENDMENTen_US
mit.metadata.statusComplete


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