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dc.contributor.authorAhn, Donghwan
dc.contributor.authorKimerling, Lionel C.
dc.contributor.authorMichel, Jurgen
dc.date.accessioned2011-12-09T20:11:35Z
dc.date.available2011-12-09T20:11:35Z
dc.date.issued2010-12
dc.date.submitted2010-08
dc.identifier.issn0733-8724
dc.identifier.otherINSPEC Accession Number: 11656183
dc.identifier.urihttp://hdl.handle.net/1721.1/67499
dc.description.abstractWe have fabricated vertical p-i-n silicon photodetectors that are monolithically integrated with compact silicon-oxynitride channel waveguides. By comparing the evanescent coupling from low index-contrast waveguides and compact, high index-contrast waveguides, the dependence of evanescent coupling behavior on the waveguide index and geometry designs was analyzed. The effects of fabrication variations in the coupling structure have been studied and it was found that an offsetting step in the waveguide can help compensate for the mode mismatch at the transition interface from the input bus waveguide to the waveguide on top of the photodetector. Finally, we present a design map, built by drawing the evanescent coupling rate contour lines in the waveguide design space, which well predicts the evanescent coupling trends.en_US
dc.description.sponsorshipUnited States. Defense Advanced Research Projects Agency (DARPA EPIC Program, Contract HR0011-05-C-0027)en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/jlt.2010.2086433en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleEvanescent Coupling Device Design for Waveguide-Integrated Group IV Photodetectorsen_US
dc.typeArticleen_US
dc.identifier.citationDonghwan Ahn, L.C. Kimerling, and J. Michel. “Evanescent Coupling Device Design for Waveguide-Integrated Group IV Photodetectors.” Lightwave Technology, Journal of 28.23 (2010): 3387-3394. © 2010 IEEE.en_US
dc.contributor.departmentMIT Materials Research Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.approverKimerling, Lionel C.
dc.contributor.mitauthorKimerling, Lionel C.
dc.contributor.mitauthorAhn, Donghwan
dc.contributor.mitauthorMichel, Jurgen
dc.relation.journalJournal of Lightwave Technologyen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsDonghwan Ahn; Kimerling, L C; Michel, Jen
dc.identifier.orcidhttps://orcid.org/0000-0002-3913-6189
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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