Capacitance of graphene bilayer as a probe of layer-specific properties

Abstract

The unique capabilities of capacitance measurements in bilayer graphene enable probing of layer-specific properties that are normally out of reach in transport measurements. Furthermore, capacitance measurements in the top-gate and penetration field geometries are sensitive to different physical quantities: The penetration field capacitance probes the two layers equally, whereas the top-gate capacitance preferentially samples the near layer, resulting in the "near-layer capacitance enhancement" effect observed in recent top-gate capacitance measurements. We present a detailed theoretical description of this effect and show that capacitance can be used to determine the equilibrium layer polarization, a potentially useful tool in the study of broken symmetry states in graphene, stemming from the interplay between interlayer screening, disorder, and the inverse-square-root van Hove singularity particular to the bilayer graphene band structure. We show how capacitance experiments can be used to probe the ground-state layer polarization, a potentially useful tool in the study of broken symmetry states in graphene.