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Thermal Conductivity Spectroscopy Technique to Measure Phonon Mean Free Paths

Author(s)
Schmidt, A. J.; Minnich, Austin Jerome; Johnson, Jeremiah A.; Esfarjani, Keivan; Dresselhaus, Mildred; Nelson, Keith Adam; Chen, Gang; ... Show more Show less
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Abstract
Size effects in heat conduction, which occur when phonon mean free paths (MFPs) are comparable to characteristic lengths, are being extensively explored in many nanoscale systems for energy applications. Knowledge of MFPs is essential to understanding size effects, yet MFPs are largely unknown for most materials. Here, we introduce the first experimental technique which can measure MFP distributions over a wide range of length scales and materials. Using this technique, we measure the MFP distribution of silicon for the first time and obtain good agreement with first-principles calculations.
Date issued
2011-08
URI
http://hdl.handle.net/1721.1/68676
Department
Massachusetts Institute of Technology. Department of Chemistry; Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science; Massachusetts Institute of Technology. Department of Mechanical Engineering
Journal
Physical Review Letters
Publisher
American Physical Society (APS)
Citation
Minnich, A. et al. “Thermal Conductivity Spectroscopy Technique to Measure Phonon Mean Free Paths.” Physical Review Letters 107.9 (2011): n. pag. Web. 27 Jan. 2012. © 2011 American Physical Society
Version: Final published version
ISSN
0031-9007
1079-7114

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