dc.contributor.author | Liu, Ce | |
dc.contributor.author | Sharan, Lavanya | |
dc.contributor.author | Adelson, Edward H. | |
dc.contributor.author | Rosenholtz, Ruth | |
dc.date.accessioned | 2012-03-02T16:38:20Z | |
dc.date.available | 2012-03-02T16:38:20Z | |
dc.date.issued | 2010-08 | |
dc.identifier.isbn | 978-1-4244-6984-0 | |
dc.identifier.isbn | 978-1-4244-6985-7 | |
dc.identifier.issn | 1063-6919 | |
dc.identifier.other | INSPEC Accession Number: 11500638 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/69562 | |
dc.description.abstract | We are interested in identifying the material category, e.g. glass, metal, fabric, plastic or wood, from a single image of a surface. Unlike other visual recognition tasks in computer vision, it is difficult to find good, reliable features that can tell material categories apart. Our strategy is to use a rich set of low and mid-level features that capture various aspects of material appearance. We propose an augmented Latent Dirichlet Allocation (aLDA) model to combine these features under a Bayesian generative framework and learn an optimal combination of features. Experimental results show that our system performs material recognition reasonably well on a challenging material database, outperforming state-of-the-art material/texture recognition systems. | en_US |
dc.language.iso | en_US | |
dc.publisher | Institute of Electrical and Electronics Engineers | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1109/CVPR.2010.5540207 | en_US |
dc.source | IEEE | en_US |
dc.title | Exploring features in a Bayesian framework for material recognition | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Liu, Ce et al. “Exploring Features in a Bayesian Framework for Material Recognition.” IEEE, 2010 Computer Vision and Pattern Recognition (CVPR), IEEE Conference on, p. 239–246. © Copyright 2010 IEEE. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Brain and Cognitive Sciences | en_US |
dc.contributor.approver | Adelson, Edward H. | |
dc.contributor.mitauthor | Liu, Ce | |
dc.contributor.mitauthor | Sharan, Lavanya | |
dc.contributor.mitauthor | Adelson, Edward H. | |
dc.contributor.mitauthor | Rosenholtz, Ruth | |
dc.relation.journal | Proceedings of the 2010 IEEE Conference on Computer Vision and Pattern Recognition, (CVPR) | en_US |
dc.eprint.version | Final published version | en_US |
dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
dspace.orderedauthors | Liu, Ce; Sharan, Lavanya; Adelson, Edward H.; Rosenholtz, Ruth | en |
dc.identifier.orcid | https://orcid.org/0000-0003-2222-6775 | |
mit.license | PUBLISHER_POLICY | en_US |
mit.metadata.status | Complete | |