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dc.contributor.authorLiu, Ce
dc.contributor.authorSharan, Lavanya
dc.contributor.authorAdelson, Edward H.
dc.contributor.authorRosenholtz, Ruth
dc.date.accessioned2012-03-02T16:38:20Z
dc.date.available2012-03-02T16:38:20Z
dc.date.issued2010-08
dc.identifier.isbn978-1-4244-6984-0
dc.identifier.isbn978-1-4244-6985-7
dc.identifier.issn1063-6919
dc.identifier.otherINSPEC Accession Number: 11500638
dc.identifier.urihttp://hdl.handle.net/1721.1/69562
dc.description.abstractWe are interested in identifying the material category, e.g. glass, metal, fabric, plastic or wood, from a single image of a surface. Unlike other visual recognition tasks in computer vision, it is difficult to find good, reliable features that can tell material categories apart. Our strategy is to use a rich set of low and mid-level features that capture various aspects of material appearance. We propose an augmented Latent Dirichlet Allocation (aLDA) model to combine these features under a Bayesian generative framework and learn an optimal combination of features. Experimental results show that our system performs material recognition reasonably well on a challenging material database, outperforming state-of-the-art material/texture recognition systems.en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/CVPR.2010.5540207en_US
dc.sourceIEEEen_US
dc.titleExploring features in a Bayesian framework for material recognitionen_US
dc.typeArticleen_US
dc.identifier.citationLiu, Ce et al. “Exploring Features in a Bayesian Framework for Material Recognition.” IEEE, 2010 Computer Vision and Pattern Recognition (CVPR), IEEE Conference on, p. 239–246. © Copyright 2010 IEEE.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Brain and Cognitive Sciencesen_US
dc.contributor.approverAdelson, Edward H.
dc.contributor.mitauthorLiu, Ce
dc.contributor.mitauthorSharan, Lavanya
dc.contributor.mitauthorAdelson, Edward H.
dc.contributor.mitauthorRosenholtz, Ruth
dc.relation.journalProceedings of the 2010 IEEE Conference on Computer Vision and Pattern Recognition, (CVPR)en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dspace.orderedauthorsLiu, Ce; Sharan, Lavanya; Adelson, Edward H.; Rosenholtz, Ruthen
dc.identifier.orcidhttps://orcid.org/0000-0003-2222-6775
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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