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dc.contributor.authorMani, Ali
dc.contributor.authorBazant, Martin Z.
dc.date.accessioned2012-03-02T18:36:56Z
dc.date.available2012-03-02T18:36:56Z
dc.date.issued2011-12
dc.date.submitted2011-07
dc.identifier.issn1539-3755
dc.identifier.issn1550-2376
dc.identifier.urihttp://hdl.handle.net/1721.1/69569
dc.description.abstractSalt transport in bulk electrolytes is limited by diffusion and advection, but in microstructures with charged surfaces (e.g., microfluidic devices, porous media, soils, or biological tissues) surface conduction and electro-osmotic flow also contribute to ionic fluxes. For small applied voltages, these effects lead to well known linear electrokinetic phenomena. In this paper, we predict some surprising nonlinear dynamics that can result from the competition between bulk and interfacial transport at higher voltages. When counterions are selectively removed by a membrane or electrode, a “deionization shock” can propagate through the microstructure, leaving in its wake an ultrapure solution, nearly devoid of coions and colloidal impurities. We elucidate the basic physics of deionization shocks and develop a mathematical theory of their existence, structure, and stability, allowing for slow variations in surface charge or channel geometry. Via asymptotic approximations and similarity solutions, we show that deionization shocks accelerate and sharpen in narrowing channels, while they decelerate and weaken, and sometimes disappear, in widening channels. These phenomena may find applications in separations (deionization, decontamination, biological assays) and energy storage (batteries, supercapacitors) involving electrolytes in microstructures.en_US
dc.description.sponsorshipMassachusetts Institute of Technology. Energy Initiativeen_US
dc.language.isoen_US
dc.publisherAmerican Physical Society (APS)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevE.84.061504en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleDeionization shocks in microstructuresen_US
dc.typeArticleen_US
dc.identifier.citationMani, Ali, and Martin Z. Bazant. “Deionization Shocks in Microstructures.” Physical Review E 84.6 (2011): n. pag. Web. 2 Mar. 2012. Mani, Ali, and Martin Z. Bazant. “Deionization Shocks in Microstructures.” Physical Review E 84.6 (2011): n. pag. Web. 2 Mar. 2012. © 2011 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemical Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mathematicsen_US
dc.contributor.approverBazant, Martin Z.
dc.contributor.mitauthorBazant, Martin Z.
dc.relation.journalPhysical Review Een_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsMani, Ali; Bazant, Martin Z.en
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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