Hierarchical bayesian modeling of inter-trial variability and variational Bayesian learning of common spatial patterns from multichannel EEG
Author(s)
Wu, Wei; Chen, Zhe; Gao, Shangkai; Brown, Emery N.
DownloadBrown-2010-Hierarchical Bayesian modeling.pdf (210.2Kb)
PUBLISHER_POLICY
Publisher Policy
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Terms of use
Metadata
Show full item recordAbstract
In numerous neuroscience studies, multichannel EEG data are often recorded over multiple trial periods under the same experimental condition. To date, little effort is aimed to learn spatial patterns from EEG data to account for trial-to-trial variability. In this paper, a hierarchical Bayesian framework is introduced to model inter-trial source variability while extracting common spatial patterns under multiple experimental conditions in a supervised manner. We also present a variational Bayesian algorithm for model inference, by which the number of sources can be determined effectively via automatic relevance determination (ARD). The efficacy of the proposed learning algorithm is validated with both synthetic and real EEG data. Using two brain-computer interface (BCI) motor imagery data sets we show the proposed algorithm consistently outperforms the common spatial patterns (CSP) algorithm while attaining comparable performance with a recently proposed discriminative approach.
Date issued
2010-06Department
Massachusetts Institute of Technology. Department of Brain and Cognitive SciencesJournal
Proceedings of the 2010 IEEE International Conference on Acoustics Speech and Signal Processing (ICASSP)
Publisher
Institute of Electrical and Electronics Engineers
Citation
Wu, Wei et al. “Hierarchical Bayesian Modeling of Inter-trial Variability and Variational Bayesian Learning of Common Spatial Patterns from Multichannel EEG.” in Proceedings of the 2010 IEEE International Conference on Acoustics Speech and Signal Processing (ICASSP), 2010. 501–504. © 2010 IEEE.
Version: Final published version
ISBN
978-1-4244-4295-9
978-1-4244-4296-6
ISSN
1520-6149