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dc.contributor.authorAvidan, Shai
dc.contributor.authorCho, Taeg Sang
dc.contributor.authorFreeman, William T.
dc.date.accessioned2012-04-04T16:57:40Z
dc.date.available2012-04-04T16:57:40Z
dc.date.issued2009-06
dc.date.submitted2008-11
dc.identifier.issn0162-8828
dc.identifier.issn2160-9292
dc.identifier.otherINSPEC Accession Number: 11373236
dc.identifier.urihttp://hdl.handle.net/1721.1/69927
dc.description.abstractThe patch transform represents an image as a bag of overlapping patches sampled on a regular grid. This representation allows users to manipulate images in the patch domain, which then seeds the inverse patch transform to synthesize modified images. Possible modifications include the spatial locations of patches, the size of the output image, or the pool of patches from which an image is reconstructed. When no modifications are made, the inverse patch transform reduces to solving a jigsaw puzzle. The inverse patch transform is posed as a patch assignment problem on a Markov random field (MRF), where each patch should be used only once and neighboring patches should fit to form a plausible image. We find an approximate solution to the MRF using loopy belief propagation, introducing an approximation that encourages the solution to use each patch only once. The image reconstruction algorithm scales well with the total number of patches through label pruning. In addition, structural misalignment artifacts are suppressed through a patch jittering scheme that spatially jitters the assigned patches. We demonstrate the patch transform and its effectiveness on natural images.en_US
dc.description.sponsorshipUnited States. Office of Naval Research. Multidisciplinary University Research Initiative (grant N00014-06-1-0734)en_US
dc.description.sponsorshipShell Researchen_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/TPAMI.2009.133en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleThe Patch Transformen_US
dc.typeArticleen_US
dc.identifier.citationTaeg Sang Cho, Shai Avidan, and William T Freeman. “The Patch Transform.” IEEE Transactions on Pattern Analysis and Machine Intelligence 32.8 (2010): 1489–1501. Web. 4 Apr. 2012. © 2009 Institute of Electrical and Electronics Engineersen_US
dc.contributor.departmentMassachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.approverFreeman, William T.
dc.contributor.mitauthorCho, Taeg Sang
dc.contributor.mitauthorFreeman, William T.
dc.relation.journalIEEE Transactions on Pattern Analysis and Machine Intelligenceen_US
dc.eprint.versionFinal published versionen_US
dc.identifier.pmid20558879
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsTaeg Sang Cho; Avidan, Shai; Freeman, William Ten
dc.identifier.orcidhttps://orcid.org/0000-0002-2231-7995
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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