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dc.contributor.authorErtekin, Elif
dc.contributor.authorWinkler, Mark Thomas
dc.contributor.authorRecht, Daniel
dc.contributor.authorSaid, Aurore J.
dc.contributor.authorAziz, Michael J.
dc.contributor.authorGrossman, Jeffrey C.
dc.contributor.authorBuonassisi, Anthony
dc.date.accessioned2012-07-10T14:53:37Z
dc.date.available2012-07-10T14:53:37Z
dc.date.issued2012-01
dc.date.submitted2011-10
dc.identifier.issn0031-9007
dc.identifier.issn1079-7114
dc.identifier.urihttp://hdl.handle.net/1721.1/71567
dc.description.abstractHyperdoping has emerged as a promising method for designing semiconductors with unique optical and electronic properties, although such properties currently lack a clear microscopic explanation. Combining computational and experimental evidence, we probe the origin of sub–band-gap optical absorption and metallicity in Se-hyperdoped Si. We show that sub–band-gap absorption arises from direct defect–to–conduction-band transitions rather than free carrier absorption. Density functional theory predicts the Se-induced insulator-to-metal transition arises from merging of defect and conduction bands, at a concentration in excellent agreement with experiment. Quantum Monte Carlo calculations confirm the critical concentration, demonstrate that correlation is important to describing the transition accurately, and suggest that it is a classic impurity-driven Mott transition.en_US
dc.description.sponsorshipUnited States. Dept. of Energy (Grant DE-SC0002623)en_US
dc.description.sponsorshipNational Center for Supercomputing Applications (Grant TG-DMR090027)en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Contract DMR 04-20415)en_US
dc.description.sponsorshipUnited States. Army Research Office (Grant W911NF-10-1-0442)en_US
dc.description.sponsorshipArmy Armament Research, Development, and Engineering Center (U.S.) (Contract No. W15QKN-07-P-0092)en_US
dc.language.isoen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevLett.108.026401en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleInsulator-to-Metal Transition in Selenium-Hyperdoped Silicon: Observation and Originen_US
dc.typeArticleen_US
dc.identifier.citationErtekin, Elif et al. “Insulator-to-Metal Transition in Selenium-Hyperdoped Silicon: Observation and Origin.” Physical Review Letters 108.2 (2012). © 2012 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Laboratory for Manufacturing and Productivityen_US
dc.contributor.approverGrossman, Jeffrey C.
dc.contributor.mitauthorErtekin, Elif
dc.contributor.mitauthorWinkler, Mark Thomas
dc.contributor.mitauthorBuonassisi, Tonio
dc.contributor.mitauthorGrossman, Jeffrey C.
dc.relation.journalPhysical Review Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsErtekin, Elif; Winkler, Mark; Recht, Daniel; Said, Aurore; Aziz, Michael; Buonassisi, Tonio; Grossman, Jeffreyen
dc.identifier.orcidhttps://orcid.org/0000-0003-1281-2359
dc.identifier.orcidhttps://orcid.org/0000-0001-8345-4937
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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