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dc.contributor.authorDavis, Randall
dc.contributor.authorOuyang, Tom Yu
dc.date.accessioned2012-07-11T12:56:32Z
dc.date.available2012-07-11T12:56:32Z
dc.date.issued2009-07
dc.date.submitted2009
dc.identifier.isbn978-1-57735-426-0
dc.identifier.urihttp://hdl.handle.net/1721.1/71572
dc.description.abstractThere is increasing interest in building systems that can automatically interpret hand-drawn sketches. However, many challenges remain in terms of recognition accuracy, robustness to different drawing styles, and ability to generalize across multiple domains. To address these challenges, we propose a new approach to sketched symbol recognition that focuses on the visual appearance of the symbols. This allows us to better handle the range of visual and stroke-level variations found in freehand drawings. We also present a new symbol classifier that is computationally efficient and invariant to rotation and local deformations. We show that our method exceeds state-of-the-art performance on all three domains we evaluated, including handwritten digits, PowerPoint shapes, and electrical circuit symbols.en_US
dc.language.isoen_US
dc.publisherMorgan Kaufmann Publishers Inc.en_US
dc.relation.isversionofhttp://dl.acm.org/citation.cfm?id=1661680en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alike 3.0en_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/en_US
dc.sourceDavis via Amy Stouten_US
dc.titleA visual approach to sketched symbol recognitionen_US
dc.typeArticleen_US
dc.identifier.citationTom Y. Ouyang and Randall Davis. 2009. A visual approach to sketched symbol recognition. In Proceedings of the 21st international jont conference on Artifical intelligence (IJCAI'09), Hiroaki Kitano (Ed.). Morgan Kaufmann Publishers Inc., San Francisco, CA, USA, 1463-1468.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.approverDavis, Randall
dc.contributor.mitauthorDavis, Randall
dc.contributor.mitauthorOuyang, Tom Yu
dc.relation.journalProceedings of the 21st International Joint Conference on Artifical Intelligence, IJCAI '09en_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dspace.orderedauthorsOuyang, Tom Y.; Davis, Randallen_US
dc.identifier.orcidhttps://orcid.org/0000-0001-5232-7281
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


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