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dc.contributor.authorErtekin, Elif
dc.contributor.authorSrinivasan, Varadharajan
dc.contributor.authorRavichandran, Jayakanth
dc.contributor.authorRossen, Pim B.
dc.contributor.authorSiemons, Wolter
dc.contributor.authorMajumdar, Arun
dc.contributor.authorRamesh, Ramamoorthy
dc.contributor.authorGrossman, Jeffrey C.
dc.date.accessioned2012-07-18T17:18:12Z
dc.date.available2012-07-18T17:18:12Z
dc.date.issued2012-05
dc.date.submitted2012-04
dc.identifier.issn1098-0121
dc.identifier.issn1550-235X
dc.identifier.urihttp://hdl.handle.net/1721.1/71686
dc.description.abstractUsing both computational and experimental analysis, we demonstrate a rich point-defect phase diagram in doped strontium titanate as a function of thermodynamic variables such as oxygen partial pressure and electronic chemical potential. Computational modeling of point-defect energetics demonstrates that a complex interplay exists between dopants, thermodynamic parameters, and intrinsic defects in thin films of SrTiO[subscript 3] (STO). We synthesize STO thin films via pulsed laser deposition and explore this interplay between intrinsic defects, doping, compensation, and carrier concentration. Our point-defect analysis (i) demonstrates that careful control over growth conditions can result in the tunable presence of anion and cation vacancies, (ii) suggests that compensation mechanisms will pose intrinsic limits on the dopability of perovskites, and (iii) provides a guide for tailoring the properties of doped perovskite thin films.en_US
dc.description.sponsorshipUnited States. Dept. of Energy (Grant No. DE-SC0002623)en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (NCSA) (Grant No. TG-DMR090027)en_US
dc.description.sponsorshipUnited States. Dept. of Energy. Division of Materials Sciences and Engineering (Contract No. DE-AC02-05CH11231)en_US
dc.language.isoen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevB.85.195460en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleInterplay between intrinsic defects, doping, and free carrier concentration in SrTiO[subscript 3] thin filmsen_US
dc.typeArticleen_US
dc.identifier.citationErtekin, Elif et al. “Interplay Between Intrinsic Defects, Doping, and Free Carrier Concentration in SrTiO_{3} Thin Films.” Physical Review B 85.19 (2012). ©2012 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.approverGrossman, Jeffrey C.
dc.contributor.mitauthorErtekin, Elif
dc.contributor.mitauthorGrossman, Jeffrey C.
dc.relation.journalPhysical Review Ben_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsErtekin, Elif; Srinivasan, Varadharajan; Ravichandran, Jayakanth; Rossen, Pim B.; Siemons, Wolter; Majumdar, Arun; Ramesh, Ramamoorthy; Grossman, Jeffrey C.en
dc.identifier.orcidhttps://orcid.org/0000-0003-1281-2359
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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