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dc.contributor.authorWerley, Christopher Alan
dc.contributor.authorFan, Kebin
dc.contributor.authorStrikwerda, Andrew C.
dc.contributor.authorWu, Qiang
dc.contributor.authorLin, Kung-Hsuan
dc.contributor.authorAveritt, Richard D.
dc.contributor.authorNelson, Keith Adam
dc.date.accessioned2012-07-25T18:00:22Z
dc.date.available2012-07-25T18:00:22Z
dc.date.issued2009-11
dc.date.submitted2009-09
dc.identifier.isbn978-1-4244-5417-4
dc.identifier.isbn978-1-4244-5416-7
dc.identifier.urihttp://hdl.handle.net/1721.1/71806
dc.description.abstractWe apply newly developed, phase-sensitive imaging to enable sharply focused visualization of terahertz waves in electro-optic media. This approach allows quantitative characterization of THz waves as they interact with microstructures on or in the sample, yielding new insight into these interactions.en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/ICIMW.2009.5324752en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleThe interaction of THz phonon-polariton waves with microstructures observed using quantitative, phase-sensitive imagingen_US
dc.typeArticleen_US
dc.identifier.citationWerley, Christopher A. et al. “The Interaction of THz Phonon-polariton Waves with Microstructures Observed Using Quantitative, Phase-sensitive Imaging.” IEEE, 2009. 1–2. © Copyright 2009 IEEEen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemistryen_US
dc.contributor.approverNelson, Keith Adam
dc.contributor.mitauthorWerley, Christopher Alan
dc.contributor.mitauthorNelson, Keith Adam
dc.relation.journal34th International Conference on Infrared, Millimeter, and Terahertz Waves, 2009en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dspace.orderedauthorsWerley, Christopher A.; Fan, Kebin; Strikwerda, Andrew C.; Wu, Qiang; Lin, Kung-Hsuan; Averitt, Richard D.; Nelson, Keith A.en
dc.identifier.orcidhttps://orcid.org/0000-0001-7804-5418
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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