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dc.contributor.authorYamashita, Hirofumi
dc.contributor.authorSodini, Charles G.
dc.date.accessioned2012-07-30T15:37:25Z
dc.date.available2012-07-30T15:37:25Z
dc.date.issued2009-10
dc.date.submitted2009-06
dc.identifier.issn0018-9383
dc.identifier.urihttp://hdl.handle.net/1721.1/71887
dc.description.abstractAn imager with an integrated fully programmable bit-serial column-parallel processor is proposed to meet the demand for a compact and versatile system-on-imager chip for consumer applications. The on-imager processor is targeting a computationally intensive low-level image processing task. The processor is physically arranged as a densely packed 2-D processing element (PE) array at an imager column level. The digital processor has a multiple-instruction-multiple-data (MIMD) architecture configuring multiple column-parallel single-instruction-multiple-data (SIMD) processors. The prototype imager chip with 128 times 128 pixels and 4 times 128 PE array designed with 0.6-mum technology was fabricated, and its functionality was tested. The estimation of performance level of the proposed processor architecture with an advanced technology such as the 0.09-mum process technology shows that the proposed imager chip architecture has a potential of giga sum operations per second per square millimeter class processing performance.en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/ted.2009.2030718en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleA CMOS Imager With a Programmable Bit-Serial Column-Parallel SIMD/MIMD Processoren_US
dc.typeArticleen_US
dc.identifier.citationYamashita, Hirofumi, and Charles G. Sodini. “A CMOS Imager With a Programmable Bit-Serial Column-Parallel SIMD/MIMD Processor.” IEEE Transactions on Electron Devices 56.11 (2009): 2534–2545. © Copyright 2009 IEEEen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.approverSodini, Charles G.
dc.contributor.mitauthorSodini, Charles G.
dc.relation.journalIEEE Transactions on Electron Devicesen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsYamashita, Hirofumi; Sodini, Charles G.en
dc.identifier.orcidhttps://orcid.org/0000-0002-0413-8774
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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