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dc.contributor.authorTyrrell, Brian M.
dc.contributor.authorAnderson, Kirk
dc.contributor.authorBaker, Justin J.
dc.contributor.authorBerger, Robert
dc.contributor.authorBrown, Matthew
dc.contributor.authorColonero, Curtis B.
dc.contributor.authorCosta, Joseph S.
dc.contributor.authorHolford, Brian
dc.contributor.authorKelly, Michael W.
dc.contributor.authorRingdahl, Eric J.
dc.contributor.authorSchultz, Kenneth I.
dc.contributor.authorWey, James R.
dc.date.accessioned2012-07-30T19:57:44Z
dc.date.available2012-07-30T19:57:44Z
dc.date.issued2009-10
dc.date.submitted2009-05
dc.identifier.urihttp://hdl.handle.net/1721.1/71899
dc.description.abstractA digital focal plane array (DFPA) architecture has been developed that incorporates per-pixel full-dynamic-range analog-to-digital conversion and orthogonal-transfer-based realtime digital signal processing capability. Several long-wave infrared-optimized pixel processing focal plane readout integrated circuit (ROIC) designs have been implemented, each accommodating a 256 times 256 30-mum-pitch detector array. Demonstrated in this paper is the application of this DFPA ROIC architecture to problems of background pedestal mitigation, wide-field imaging, image stabilization, edge detection, and velocimetry. The DFPA architecture is reviewed, and pixel performance metrics are discussed in the context of the application examples. The measured data reported here are for DFPA ROICs implemented in 90-nm CMOS technology and hybridized to Hg[sunscript x]Cd[subscript 1-x]Te (MCT) detector arrays with cutoff wavelengths ranging from 7 to 14.5 mum and a specified operating temperature of 60 K-80 K.en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/ted.2009.2030719en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceACSen_US
dc.titleTime Delay Integration and In-Pixel Spatiotemporal Filtering Using a Nanoscale Digital CMOS Focal Plane Readouten_US
dc.typeArticleen_US
dc.identifier.citationTyrrell, Brian et al. “Time Delay Integration and In-Pixel Spatiotemporal Filtering Using a Nanoscale Digital CMOS Focal Plane Readout.” IEEE Transactions on Electron Devices 56.11 (2009): 2516–2523. © Copyright 2009 IEEEen_US
dc.contributor.departmentLincoln Laboratoryen_US
dc.contributor.approverTyrrell, Brian M.
dc.contributor.mitauthorTyrrell, Brian M.
dc.contributor.mitauthorAnderson, Kirk
dc.contributor.mitauthorBaker, Justin J.
dc.contributor.mitauthorBerger, Robert
dc.contributor.mitauthorBrown, Matthew
dc.contributor.mitauthorColonero, Curtis B.
dc.contributor.mitauthorCosta, Joseph S.
dc.contributor.mitauthorHolford, Brian
dc.contributor.mitauthorKelly, Michael W.
dc.contributor.mitauthorRingdahl, Eric J.
dc.contributor.mitauthorSchultz, Kenneth I.
dc.contributor.mitauthorWey, James R.
dc.relation.journalIEEE Transactions on Electron Devicesen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsTyrrell, Brian; Anderson, Kirk; Baker, Justin; Berger, Robert; Brown, Matthew; Colonero, Curtis; Costa, Joseph; Holford, Brian; Kelly, Michael; Ringdahl, Eric; Schultz, Kenneth; Wey, Jamesen
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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