dc.contributor.author | Hu, Juejun | |
dc.contributor.author | Musgraves, J. David | |
dc.contributor.author | Carlie, Nathan | |
dc.contributor.author | Agarwal, Anuradha Murthy | |
dc.contributor.author | Richardson, Kathleen | |
dc.contributor.author | Kimerling, Lionel C. | |
dc.date.accessioned | 2012-08-09T15:48:31Z | |
dc.date.available | 2012-08-09T15:48:31Z | |
dc.date.issued | 2011-04 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/72075 | |
dc.description | Tuesday 26 April 2011- Orlando, Florida, USA
Chemical, Biological, Radiological, Nuclear, and Explosives (CBRNE) Sensing XII | en_US |
dc.description.abstract | Nano-cavity photothermal spectroscopy is a novel technique for ultra-sensitive chem-bio detection. We illustrate that through simultaneous localization of optical and thermal interactions in a planar nano-cavity, detection sensitivity can be improved by > 10[superscript 4] compared to state-of-the-art. Key to nano-cavity photothermal sensing is the use of novel infraredtransparent chalcogenide glasses for resonant cavity fabrication, as these glasses feature a photothermal figure-of-merit over two orders of magnitude higher than conventional materials. We demonstrate planar optical resonant cavity devices in these glasses with record cavity quality factors up to 5 × 10[superscript 5], leading to high photothermal detection sensitivity. | en_US |
dc.language.iso | en_US | |
dc.publisher | SPIE | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1117/12.883123 | en_US |
dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
dc.source | SPIE | en_US |
dc.title | Photothermal nano-cavities for ultra-sensitive chem-bio detection | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Juejun Hu, J. David Musgrave, Nathan Carlie, Anu Agarwal, Kathleen Richardson and Lionel C. Kimerling, "Photothermal nano-cavities for ultra-sensitive chem-bio detection", Proc. SPIE 8018, 80180W (2011); http://dx.doi.org/10.1117/12.883123 © 2011 COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | en_US |
dc.contributor.approver | Agarwal, Anuradha Murthy | |
dc.contributor.mitauthor | Agarwal, Anuradha Murthy | |
dc.contributor.mitauthor | Kimerling, Lionel C. | |
dc.relation.journal | Proceedings of SPIE--the International Society for Optical Engineering; v.8018 | en_US |
dc.eprint.version | Final published version | en_US |
dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
dspace.orderedauthors | Hu, Juejun; Musgrave, J. David; Carlie, Nathan; Agarwal, Anu; Richardson, Kathleen; Kimerling, Lionel C. | en |
dc.identifier.orcid | https://orcid.org/0000-0002-3913-6189 | |
dspace.mitauthor.error | true | |
mit.license | PUBLISHER_POLICY | en_US |
mit.metadata.status | Complete | |