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dc.contributor.authorSheng, Xing
dc.contributor.authorHu, Juejun
dc.contributor.authorMichel, Jurgen
dc.contributor.authorKimerling, Lionel C.
dc.date.accessioned2012-08-09T20:19:34Z
dc.date.available2012-08-09T20:19:34Z
dc.date.issued2012-07
dc.date.submitted2012-04
dc.identifier.issn1094-4087
dc.identifier.urihttp://hdl.handle.net/1721.1/72083
dc.description.abstractWe analytically investigate the light trapping performance in plasmonic solar cells with Si/metallic structures. We consider absorption enhancements for surface plasmon polaritons (SPPs) at planar Si/metal interfaces and localized surface plasmon resonances (LSPRs) for metallic spheres in a Si matrix. We discover that the enhancement factors at Si/metal interfaces are not bound to the conventional Lambertian limit, and strong absorption can be achieved around plasmonic resonant frequencies. In addition, those enhancements are greatly reduced as the fields decay away from the Si/metal interfaces. Therefore, localized plasmonic resonances can be used as efficient light trapping schemes for ultrathin Si solar cells (< 50 nm), while photonic guided mode enhancement is more appropriate for thicker films.en_US
dc.description.sponsorshipUnited States. Dept. of Energy (DOE Sunshot Program, award number DE-EE0005327)en_US
dc.description.sponsorshipMasdar Institute of Science and Technologyen_US
dc.language.isoen_US
dc.publisherOptical Society of Americaen_US
dc.relation.isversionofhttp://dx.doi.org/10.1364/OE.20.00A496en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceXing Shengen_US
dc.titleLight trapping limits in plasmonic solar cells: an analytical investigationen_US
dc.typeArticleen_US
dc.identifier.citationSheng, Xing et al. “Light Trapping Limits in Plasmonic Solar Cells: An Analytical Investigation.” Optics Express 20.S4 (2012): A496. Web. © 2012 OSA.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.approverKimerling, Lionel C.
dc.contributor.mitauthorSheng, Xing
dc.contributor.mitauthorMichel, Jurgen
dc.contributor.mitauthorKimerling, Lionel C.
dc.relation.journalOptics Expressen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsSheng, Xing; Hu, Juejun; Michel, Jurgen; Kimerling, Lionel C.en
dc.identifier.orcidhttps://orcid.org/0000-0002-3913-6189
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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