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Microfabricated surface ion trap on a high-finesse optical mirror

dc.contributor.authorHerskind, Peter F.
dc.contributor.authorShi, Molu
dc.contributor.authorGe, Yufei
dc.contributor.authorCetina, Marko
dc.contributor.authorChuang, Isaac L.
dc.contributor.authorWang, Shannon X.
dc.date.accessioned2012-08-14T15:42:54Z
dc.date.available2012-08-14T15:42:54Z
dc.date.issued2011-08
dc.date.submitted2011-07
dc.identifier.issn0146-9592
dc.identifier.issn1539-4794
dc.identifier.urihttp://hdl.handle.net/1721.1/72117
dc.description.abstractA novel approach to optics integration in ion traps is demonstrated based on a surface electrode ion trap that is microfabricated on top of a dielectric mirror. Additional optical losses due to fabrication are found to be as low as 80 ppm for light at 422 nm . The integrated mirror is used to demonstrate light collection from, and imaging of, a single [superscript 88]Sr[superscript +] ion trapped 169±4 μm above the mirror.en_US
dc.description.sponsorshipNational Science Foundation (U.S.). Center for Ultracold Atomsen_US
dc.description.sponsorshipUnited States. Army Research Office. Comprehensive Materials and Morphologies Study of Ion Trapsen_US
dc.description.sponsorshipCarlsberg Foundationen_US
dc.description.sponsorshipLundbeck Foundationen_US
dc.language.isoen_US
dc.publisherOptical Society of Americaen_US
dc.relation.isversionofhttp://dx.doi.org/10.1364/OL.36.003045en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceMIT web domainen_US
dc.titleMicrofabricated surface ion trap on a high-finesse optical mirroren_US
dc.typeArticleen_US
dc.identifier.citationHerskind, Peter F. et al. “Microfabricated Surface Ion Trap on a High-finesse Optical Mirror.” Optics Letters 36.16 (2011): 3045. © 2011 Optical Society of Americaen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.departmentMIT-Harvard Center for Ultracold Atomsen_US
dc.contributor.approverChuang, Isaac
dc.contributor.mitauthorHerskind, Peter F.
dc.contributor.mitauthorWang, Shannon Xuanyue
dc.contributor.mitauthorShi, Molu
dc.contributor.mitauthorGe, Yufei
dc.contributor.mitauthorCetina, Marko
dc.contributor.mitauthorChuang, Isaac L.
dc.relation.journalOptics Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsHerskind, Peter F.; Wang, Shannon X.; Shi, Molu; Ge, Yufei; Cetina, Marko; Chuang, Isaac L.en
dc.identifier.orcidhttps://orcid.org/0000-0001-7296-523X
dc.identifier.orcidhttps://orcid.org/0000-0001-8586-4999
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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