| dc.contributor.author | Wichakool, Warit | |
| dc.contributor.author | Paris, James | |
| dc.contributor.author | Avestruz, Al-Thaddeus | |
| dc.contributor.author | Leeb, Steven B. | |
| dc.date.accessioned | 2012-08-14T20:57:53Z | |
| dc.date.available | 2012-08-14T20:57:53Z | |
| dc.date.issued | 2010-03 | |
| dc.date.submitted | 2010-02 | |
| dc.identifier.isbn | 978-1-4244-4783-1 | |
| dc.identifier.isbn | 978-1-4244-4782-4 | |
| dc.identifier.issn | 1048-2334 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/72127 | |
| dc.description.abstract | This paper presents a high-resolution, physically-windowed sensor architecture that is well-suited for energy scorekeeping and diagnostic applications. The sensor can track a large-scale main signal while capturing small-scale variations. The prototype system measures a small current signal using a closed-loop Hall sensor, and extends the range by driving a compensation current through an auxiliary winding. The system combines the compensation command and the sampled output of the residual sensor to reconstruct the input signal. Results show that the prototype can measure both dc and ac currents with 10 mA resolution over a 160 A current range. | en_US |
| dc.language.iso | en_US | |
| dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1109/APEC.2010.5433611 | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | IEEE | en_US |
| dc.title | High-Resolution Physically-Windowed Sensors for Power Electronics Applications | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Wichakool, Warit et al. “High-resolution Physically-windowed Sensors for Power Electronics Applications.” 2010 Twenty-Fifth Annual IEEE Applied Power Electronics Conference and Exposition, IEEE, 2010. 580–587. © Copyright 2010 IEEE | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
| dc.contributor.approver | Leeb, Steven B. | |
| dc.contributor.mitauthor | Wichakool, Warit | |
| dc.contributor.mitauthor | Paris, James | |
| dc.contributor.mitauthor | Avestruz, Al-Thaddeus | |
| dc.contributor.mitauthor | Leeb, Steven B. | |
| dc.relation.journal | 2010 Twenty-Fifth Annual IEEE Applied Power Electronics Conference and Exposition | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
| dspace.orderedauthors | Wichakool, Warit; Paris, James; Avestruz, Al-Thaddeus; Leeb, Steven B. | en |
| dc.identifier.orcid | https://orcid.org/0000-0002-3856-6005 | |
| dc.identifier.orcid | https://orcid.org/0000-0002-3698-5660 | |
| mit.license | PUBLISHER_POLICY | en_US |
| mit.metadata.status | Complete | |
