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Compact Modeling of Nonlinear Analog Circuits Using System Identification via Semidefinite Programming and Incremental Stability Certification

Author(s)
Bond, Bradley N.; Mahmood, Zohaib; Li, Yan; Sredojevic, Ranko; Megretski, Alexandre; Stojanovic, Vladimir Marko; Avniel, Yehuda B.; Daniel, Luca; ... Show more Show less
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.

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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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Abstract
This paper presents a system identification technique for generating stable compact models of typical analog circuit blocks in radio frequency systems. The identification procedure is based on minimizing the model error over a given training data set subject to an incremental stability constraint, which is formulated as a semidefinite optimization problem. Numerical results are presented for several analog circuits, including a distributed power amplifier, as well as a MEM device. It is also shown that our dynamical models can accurately predict important circuit performance metrics, and may thus, be useful for design optimization of analog systems.
Date issued
2009-12
URI
http://hdl.handle.net/1721.1/72203
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science; Massachusetts Institute of Technology. Research Laboratory of Electronics
Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
Bond, Bradley N. et al. “Compact Modeling of Nonlinear Analog Circuits Using System Identification via Semidefinite Programming and Incremental Stability Certification.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 29.8 (2010): 1149–1162. © Copyright 2010 IEEE
Version: Final published version
ISSN
0278-0070

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