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dc.contributor.authorLi, Wei
dc.contributor.authorPage, William
dc.contributor.authorPerreault, David J.
dc.date.accessioned2012-08-30T15:59:21Z
dc.date.available2012-08-30T15:59:21Z
dc.date.issued2010-11
dc.date.submitted2010-09
dc.identifier.isbn978-1-4244-5287-3
dc.identifier.isbn978-1-4244-5286-6
dc.identifier.urihttp://hdl.handle.net/1721.1/72469
dc.description.abstractThis paper presents a study of the detailed characteristics of the new Floating Island and Thick Bottom Oxide Trench Gate MOSFET (FITMOS) developed at Toyota. FITMOS has tremendous potential for automotive applications due to its low on-resistance, improved temperature coefficient of resistance and low gate charge. During the study, the key characteristics of this novel FITMOS were investigated; a behavioral model was developed in SPICE for simulation and optimization purposes, and their applications in the design of automotive power electronics was explored. In this study, we also identify a previously unrecognized phenomenon in the FITMOS MOSFET. In particular, we show that the on-state resistance of the device depends on both frequency and peak di/dt at a given frequency. This dynamic on-resistance variation can have a significant application impact.en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/ECCE.2010.5618005en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleFITMOS modeling and dynamic on-state characteristic evaluationen_US
dc.typeArticleen_US
dc.identifier.citationLi, Wei, William Page, and David J. Perreault. “FITMOS Modeling and Dynamic On-state Characteristic Evaluation.” IEEE Energy Conversion Congress and Exposition 2010 (ECCE). 378–385. © Copyright 2010 IEEEen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Laboratory for Electromagnetic and Electronic Systemsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.approverPerreault, David J.
dc.contributor.mitauthorLi, Wei
dc.contributor.mitauthorPage, William
dc.contributor.mitauthorPerreault, David J.
dc.relation.journalIEEE Energy Conversion Congress and Exposition 2010 (ECCE)en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dspace.orderedauthorsLi, Wei; Page, William; Perreault, David J.en
dc.identifier.orcidhttps://orcid.org/0000-0002-0746-6191
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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