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Environment-assisted metrology with spin qubits

Author(s)
Cappellaro, Paola; Hodges, Jonathan S.; Goldstein, Garry; Jiang, Liang; Maze, Jeronimo R.; Sørensen, A. S.; Lukin, Mikhail D.; ... Show more Show less
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Abstract
We investigate the sensitivity of a recently proposed method for precision measurement [ Phys. Rev. Lett. 106 140502 (2011)], focusing on an implementation based on solid-state spin systems. The scheme amplifies a quantum sensor response to weak external fields by exploiting its coupling to spin impurities in the environment. We analyze the limits to the sensitivity due to decoherence and propose dynamical decoupling schemes to increase the spin coherence time. The sensitivity is also limited by the environment spin polarization; therefore, we discuss strategies to polarize the environment spins and present a method to extend the scheme to the case of zero polarization. The coherence time and polarization determine a figure of merit for the environment's ability to enhance the sensitivity compared to echo-based sensing schemes. This figure of merit can be used to engineer optimized samples for high-sensitivity nanoscale magnetic sensing, such as diamond nanocrystals with controlled impurity density.
Date issued
2012-03
URI
http://hdl.handle.net/1721.1/72570
Department
Massachusetts Institute of Technology. Department of Nuclear Science and Engineering
Journal
Physical Review A
Publisher
American Physical Society
Citation
Cappellaro, P. et al. “Environment-assisted Metrology with Spin Qubits.” Physical Review A 85.3 (2012): 032336. Copyright 2012 American Physical Society.
Version: Final published version
ISSN
1050-2947
1094-1622

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