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dc.contributor.authorChung, J. W.
dc.contributor.authorRyu, Kevin K.
dc.contributor.authorPalacios, Tomas
dc.date.accessioned2012-09-10T19:16:26Z
dc.date.available2012-09-10T19:16:26Z
dc.date.issued2010-11
dc.date.submitted2010-09
dc.identifier.isbn978-1-4244-6658-0
dc.identifier.issn1930-8876
dc.identifier.urihttp://hdl.handle.net/1721.1/72603
dc.description.abstractThe Si substrate of GaN-on-Si wafers offers new opportunities to increase the functionality and performance of nitride-based devices. This paper will review three examples of these new devices/systems. First, GaN-on-Si substrates allow the on-chip heterogeneous integration of GaN and Si electronics. Second, the easy removal of the Si substrate through dry or wet etching gives access to the N-face of the GaN layer, and all the new device structures that this orientation enables. Finally, the use of Si substrates for the growth of GaN high voltage switches makes the cost of these devices competitive with Si devices, and the total or partial etch of Si brings a new degree of freedom to increase the breakdown and performance of GaN transistors.en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/ESSDERC.2010.5617745en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleGaN-on-Si technology, a new approach for advanced devices in energy and communicationsen_US
dc.typeArticleen_US
dc.identifier.citationChung, J. W. et al. “GaN-on-Si Technology, a New Approach for Advanced Devices in Energy and Communications.” Proceedings of the European Solid-State Device Research Conference 2010 (ESSDERC). 52–56. © Copyright 2010 IEEEen_US
dc.contributor.departmentLincoln Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.approverPalacios, Tomas
dc.contributor.mitauthorChung, J. W.
dc.contributor.mitauthorRyu, Kevin K.
dc.contributor.mitauthorPalacios, Tomas
dc.relation.journalProceedings of the European Solid-State Device Research Conference 2010 (ESSDERC)en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dspace.orderedauthorsChung, J. W.; Ryu, K.; Lu, B.; Palacios, Tomasen
dc.identifier.orcidhttps://orcid.org/0000-0002-2190-563X
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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