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dc.contributor.authorNguyen, Khoa M.
dc.contributor.authorAccardi, Anthony J.
dc.contributor.authorKim, Helen H.
dc.contributor.authorWornell, Gregory W.
dc.contributor.authorSodini, Charles G.
dc.date.accessioned2012-09-11T13:56:09Z
dc.date.available2012-09-11T13:56:09Z
dc.date.issued2010-11
dc.date.submitted2010-09
dc.identifier.isbn978-1-4244-5758-8
dc.identifier.issn0886-5930
dc.identifier.urihttp://hdl.handle.net/1721.1/72608
dc.description.abstractA new technique called digital phase tightening reduces phase noise from receiver front-end circuits to allow precise phase estimation for digital beamforming in millimeter-wave (MMW) imaging applications. This is achieved by leveraging the large ratio between the MMW carrier frequency and the relatively low frame rates in imaging applications. By mixing down to an intermediate frequency (IF) and then averaging over many samples to estimate the phase, we reduce phase noise and attain phase error of the MMW beamformer in the femtosecond range. A test chip demonstrating the phase tightening concept was designed and fabricated using 0.13μm CMOS, and we show that an RMS error of 3.5fs is feasible with this technique.en_US
dc.description.sponsorshipMassachusetts Institute of Technology. Center for Integrated Circuits and Systemsen_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/CICC.2010.5617389en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleDigital Phase Tightening for Millimeter-wave Imagingen_US
dc.typeArticleen_US
dc.identifier.citationNguyen, Khoa M. et al. “Digital Phase Tightening for Millimeter-wave Imaging.” IEEE Custom Integrated Circuits Conference 2010 (CICC). 1–4. © Copyright 2010 IEEEen_US
dc.contributor.departmentLincoln Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.mitauthorKim, Helen H.
dc.contributor.mitauthorWornell, Gregory W.
dc.contributor.mitauthorSodini, Charles G.
dc.contributor.mitauthorNguyen, Khoa M.
dc.contributor.mitauthorAccardi, Anthony J.
dc.relation.journalIEEE Custom Integrated Circuits Conference 2010 (CICC)en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dspace.orderedauthorsNguyen, Khoa M.; Accardi, Anthony; Kim, Helen; Wornell, Gregory W.; Sodini, Charles G.en
dc.identifier.orcidhttps://orcid.org/0000-0002-0413-8774
dc.identifier.orcidhttps://orcid.org/0000-0001-9166-4758
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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