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dc.contributor.authorNelson, Keith Adam
dc.contributor.authorAnderson, Erik H.
dc.contributor.authorKapteyn, Henry C.
dc.contributor.authorLi, Qing
dc.contributor.authorMurname, Margaret M.
dc.contributor.authorSiemens, Mark E.
dc.contributor.authorYang, Ronggui
dc.date.accessioned2012-09-19T16:15:05Z
dc.date.available2012-09-19T16:15:05Z
dc.date.issued2010-07
dc.date.submitted2010-05
dc.identifier.isbn978-1-55752-890-2
dc.identifier.urihttp://hdl.handle.net/1721.1/73047
dc.description.abstractWe make the first observation and quantitative measurement of quasi-ballistic thermal transport from a nanoscale heat source, finding a significant decrease in energy transport away from the hotspot compared with diffusive thermal transport predictions.en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5500311en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleObservation of quasi-ballistic heat transport at nano-interfaces using coherent soft X-ray beamsen_US
dc.typeArticleen_US
dc.identifier.citationNelson, Keith Adam et al. "Observation of quasi-ballistic heat transport at nano-interfaces using coherent soft X-ray beams." Proceedings of the 2010 IEEE Conference on Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science (QELS): 1-2. © 2010 IEEE.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemistryen_US
dc.contributor.approverNelson, Keith Adam
dc.contributor.mitauthorNelson, Keith Adam
dc.relation.journalProceedings of the Conference on Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dc.identifier.orcidhttps://orcid.org/0000-0001-7804-5418
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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